Works matching IS 03615235 AND DT 2013 AND VI 42 AND IP 10
1
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2867, doi. 10.1007/s11664-013-2693-x
- Article
2
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2881, doi. 10.1007/s11664-013-2687-8
- Ohiso, Yoshitaka;
- Mitsuhara, Manabu;
- Iga, Ryuzo
- Article
3
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2905, doi. 10.1007/s11664-013-2678-9
- Article
4
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2975, doi. 10.1007/s11664-013-2690-0
- Huang, M.;
- Zhou, Q.;
- Zhao, N.;
- Zhang, Z.
- Article
5
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2961, doi. 10.1007/s11664-013-2695-8
- Wang, C.P.;
- Huang, F.;
- Lu, Y.;
- Yang, S.;
- Yang, M.J.;
- Liu, X.J.
- Article
6
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2933, doi. 10.1007/s11664-013-2674-0
- Chen, Liqin;
- Li, Bo;
- Qi, Zhaoxiong;
- Guo, Hai;
- Zhou, Ji;
- Li, Longtu
- Article
7
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2888, doi. 10.1007/s11664-013-2686-9
- Bharathan, Jayesh;
- Narayan, Jagdish;
- Rozgonyi, George;
- Bulman, Gary
- Article
8
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2897, doi. 10.1007/s11664-013-2677-x
- Joo, Sung-Jae;
- Baek, Sangwon;
- Kim, Sang-Cheol;
- Lee, Jeong-Soo
- Article
9
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2876, doi. 10.1007/s11664-013-2704-y
- Han, Jaecheon;
- Kang, Gucheol;
- Kang, Daesung;
- Moon, Yongtae;
- Jeong, Hwanhee;
- Song, June-O;
- Seong, Tae-Yeon
- Article
10
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2910, doi. 10.1007/s11664-013-2684-y
- Yang, Ru-Yuan;
- Peng, Yu-Ming;
- Su, Yan-Kuin
- Article
11
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2857, doi. 10.1007/s11664-013-2699-4
- Article
12
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2953, doi. 10.1007/s11664-013-2700-2
- George, Aneesh;
- Thomas, J.K.;
- John, Annamma;
- Solomon, Sam
- Article
13
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2940, doi. 10.1007/s11664-013-2679-8
- Grytsiv, A.;
- Rogl, P.;
- Michor, H.;
- Bauer, E.;
- Giester, G.
- Article
14
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2990, doi. 10.1007/s11664-013-2692-y
- Liu, Jianguo;
- Jiang, Min;
- Zeng, Xiaoyan
- Article
15
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2983, doi. 10.1007/s11664-013-2689-6
- Albers, Willem;
- Karttunen, Mikko;
- Wikström, Lisa;
- Vilkman, Taisto
- Article
16
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2926, doi. 10.1007/s11664-013-2673-1
- Bian, Yanlong;
- Wang, Hui;
- Zhai, Jiwei
- Article
17
- Journal of Electronic Materials, 2013, v. 42, n. 10, p. 2915, doi. 10.1007/s11664-013-2694-9
- Janghouri, Mohammad;
- Mohajerani, Ezeddin;
- Amini, Mostafa;
- Najafi, Ezzatollah;
- Hosseini, Hadi
- Article