Works matching IS 03615235 AND DT 2012 AND VI 41 AND IP 9
1
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2326, doi. 10.1007/s11664-012-2154-y
- Lan, T.;
- Chen, Y.;
- Ho, J.;
- Shyu, S.
- Article
2
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2588, doi. 10.1007/s11664-012-2033-6
- Chuang, Cheng-Li;
- Kang, Min-Yi
- Article
3
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2463, doi. 10.1007/s11664-012-2061-2
- Fakpan, Kittichai;
- Otsuka, Yuichi;
- Mutoh, Yoshiharu;
- Inoue, Shunsuke;
- Nagata, Kohsoku;
- Kodani, Kazuya
- Article
4
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2453, doi. 10.1007/s11664-012-2060-3
- Liu, H.;
- Wang, K.;
- Aasmundtveit, K.E.;
- Hoivik, N.
- Article
5
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2470, doi. 10.1007/s11664-012-2072-z
- Pan, Hsiao-An;
- Lin, Chi-Pu;
- Chen, Chih-Ming
- Article
6
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2313, doi. 10.1007/s11664-012-2090-x
- Nikolaeva, A.A.;
- Konopko, L.A.;
- Huber, T.E.;
- Bodiul, P.P.;
- Popov, I.A.;
- Moloshnik, E.F.
- Article
7
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2393, doi. 10.1007/s11664-012-2080-z
- Iqbal, Yaseen;
- Manan, Abdul
- Article
8
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2599, doi. 10.1007/s11664-012-2105-7
- Cui, Hui-wang;
- Li, Dong-sheng;
- Fan, Qiong
- Article
9
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2527, doi. 10.1007/s11664-012-2102-x
- Ho, Li-Ngee;
- Nishikawa, Hiroshi
- Article
10
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2533, doi. 10.1007/s11664-012-2117-3
- Heryanto, A.;
- Putra, W.N.;
- Trigg, A.;
- Gao, S.;
- Kwon, W.S.;
- Che, F.X.;
- Ang, X.F.;
- Wei, J.;
- I Made, R.;
- Gan, C.L.;
- Pey, K.L.
- Article
11
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2543, doi. 10.1007/s11664-012-2134-2
- Wang, Tao;
- Zhao, Meihua;
- Chen, Xu;
- Lu, Guo-Quan;
- Ngo, Khai;
- Luo, Shufang
- Article
12
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2362, doi. 10.1007/s11664-012-2132-4
- Basu, Sarbani;
- Singh, Pramod;
- Ghanshyam, C.;
- Kapur, Pawan;
- Wang, Yeong-Her
- Article
13
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2553, doi. 10.1007/s11664-012-2140-4
- Roberson, D.A.;
- Wicker, R.B.;
- MacDonald, E.
- Article
14
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2317, doi. 10.1007/s11664-012-2143-1
- Drasar, C.;
- Ruleova, P.;
- Benes, L.;
- Lostak, P.
- Article
15
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2478, doi. 10.1007/s11664-012-2142-2
- Han, Y.;
- Jing, H.;
- Nai, S.;
- Xu, L.;
- Tan, C.;
- Wei, J.
- Article
16
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2369, doi. 10.1007/s11664-012-2147-x
- Sun, Xida;
- Huang, Hong;
- Chu, Kuan-Lun;
- Zhuang, Yan
- Article
17
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2322, doi. 10.1007/s11664-012-2146-y
- Zhou, Chuanle;
- Nguyen, B.;
- Razeghi, M.;
- Grayson, M.
- Article
18
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2419, doi. 10.1007/s11664-012-2148-9
- Cheng, Shunfeng;
- Tom, Kwok;
- Pecht, Michael
- Article
19
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2567, doi. 10.1007/s11664-012-2153-z
- Peng, L.;
- Lim, D.F.;
- Zhang, L.;
- Li, H.Y.;
- Tan, C.S.
- Article
20
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2376, doi. 10.1007/s11664-012-2155-x
- Zhu, Guisheng;
- Zhi, Li;
- Yang, Huijuan;
- Xu, Huarui;
- Yu, Aibing
- Article
21
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2606, doi. 10.1007/s11664-012-2151-1
- Ludwig, Christian;
- Kuna, Meinhard
- Article
22
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2487, doi. 10.1007/s11664-012-2156-9
- Chen, Cai;
- Zhang, Lei;
- Zhao, Jiaxi;
- Cao, Lihua;
- Shang, J.
- Article
23
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2380, doi. 10.1007/s11664-012-2166-7
- Han, Dong-Suk;
- Moon, Yeon-Keon;
- Lee, Sih;
- Kim, Kyung-Taek;
- Moon, Dae-Yong;
- Lee, Sang-Ho;
- Kim, Woong-Sun;
- Park, Jong-Wan
- Article
24
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2573, doi. 10.1007/s11664-012-2167-6
- Ito, Takeyasu;
- Ogura, Tomo;
- Hirose, Akio
- Article
25
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2439, doi. 10.1007/s11664-012-2163-x
- Yu, Li;
- Zhang, Yi-He;
- Shang, Jiwu;
- Ke, Shan-Ming;
- Tong, Wang-shu;
- Shen, Bo;
- Huang, Hai-Tao
- Article
26
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2495, doi. 10.1007/s11664-012-2157-8
- Yuan, Yuan;
- Li, Dajian;
- Liu, Libin;
- Borzone, Gabriella
- Article
27
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2411, doi. 10.1007/s11664-012-2123-5
- He, Yu;
- Guo, Wenjuan;
- Pei, Meishan;
- Zhang, Guangyou;
- Jiang, Junzi
- Article
28
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2338, doi. 10.1007/s11664-012-2159-6
- Bhaskar, Ankam;
- Liu, Chia-Jyi;
- Yuan, J.J.
- Article
29
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2345, doi. 10.1007/s11664-012-2164-9
- Junesand, Carl;
- Hu, Chen;
- Wang, Zhechao;
- Metaferia, Wondwosen;
- Dagur, Pritesh;
- Pozina, Galia;
- Hultman, Lars;
- Lourdudoss, Sebastian
- Article
30
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2405, doi. 10.1007/s11664-012-2160-0
- Article
31
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2331, doi. 10.1007/s11664-012-2149-8
- Shi, Xinghua;
- Zamanipour, Zahra;
- Krasinski, Jerzy;
- Tree, Alan;
- Vashaee, Daryoosh
- Article
32
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2350, doi. 10.1007/s11664-012-2158-7
- Tiras, E.;
- Ardali, S.;
- Arslan, E.;
- Ozbay, E.
- Article
33
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2387, doi. 10.1007/s11664-012-2174-7
- Abdul Gafoor, A.K.;
- Musthafa, M.M.;
- Pradyumnan, P.P.
- Article
34
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2447, doi. 10.1007/s11664-012-2173-8
- Tang, Rupei;
- Zhang, Wenqing;
- Qian, Deping;
- Zheng, Hua;
- Tan, Zhan'ao
- Article
35
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2631, doi. 10.1007/s11664-012-2145-z
- Shnawah, Dhafer;
- Said, Suhana;
- Sabri, Mohd;
- Badruddin, Irfan;
- Che, Fa
- Article
36
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2399, doi. 10.1007/s11664-012-2152-0
- Article
37
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2621, doi. 10.1007/s11664-012-2172-9
- Chuang, Cheng-Li;
- Aoh, Jong-Ning;
- Pan, Chi-Chuan
- Article
38
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2580, doi. 10.1007/s11664-012-2177-4
- Chung, D.D.L.;
- Takizawa, Yoshihiro
- Article
39
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2502, doi. 10.1007/s11664-012-2175-6
- Chu, Ming-Hui;
- Liang, S.W.;
- Chen, Chih;
- Huang, Annie
- Article
40
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2613, doi. 10.1007/s11664-012-2165-8
- Li, Jue;
- Tarvainen, Tapio;
- Rich, Jaana;
- Turunen, Markus;
- Paulasto-Kröckel, Mervi
- Article
41
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2431, doi. 10.1007/s11664-012-2162-y
- Kong, Fangfang;
- Liu, Congcong;
- Xu, Jingkun;
- Huang, Yao;
- Wang, Jianmin;
- Sun, Zhi
- Article
42
- 2012
- Okamura, Chinatsu;
- Ueda, Takashi;
- Hasezaki, Kazuhiro
- Correction Notice
43
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2307, doi. 10.1007/s11664-012-2178-3
- Taylor, Patrick;
- Maddux, Jay;
- Uppal, Parvez
- Article
44
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2508, doi. 10.1007/s11664-012-2179-2
- Han, Sungwon;
- Osterman, Michael;
- Meschter, Stephan;
- Pecht, Michael
- Article
45
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2519, doi. 10.1007/s11664-012-2180-9
- Yazzie, K.E.;
- Williams, J.J.;
- Chawla, N.
- Article