Works matching IS 03615235 AND DT 2012 AND VI 41 AND IP 8
1
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2238, doi. 10.1007/s11664-012-2051-4
- Chen, Huanbei;
- Zhai, Jiwei
- Article
2
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2225, doi. 10.1007/s11664-012-2038-1
- Xia, Xugui;
- Qiu, Pengfei;
- Shi, Xun;
- Li, Xiaoya;
- Huang, Xiangyang;
- Chen, Lidong
- Article
3
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2210, doi. 10.1007/s11664-012-2042-5
- Sarswat, Prashant;
- Free, Michael
- Article
4
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2100, doi. 10.1007/s11664-012-2043-4
- Zhao, Guoji;
- Sheng, Guangmin;
- Luo, Jun;
- Yuan, Xinjian
- Article
5
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2035, doi. 10.1007/s11664-012-2075-9
- Takamatsu, Yoshiko;
- Esaka, Hisao;
- Shinozuka, Kei
- Article
6
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2286, doi. 10.1007/s11664-012-2044-3
- Alam, Mohammed;
- Azarian, Michael;
- Pecht, Michael
- Article
7
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2051, doi. 10.1007/s11664-012-2064-z
- Zang, Likun;
- Yuan, Zhangfu;
- Cao, Zhanmin;
- Matsuura, Hiroyuki;
- Tsukihashi, Fumitaka
- Article
8
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2089, doi. 10.1007/s11664-012-2079-5
- Fei, Huiyang;
- Yazzie, Kyle;
- Chawla, Nikhilesh;
- Jiang, Hanqing
- Article
9
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2274, doi. 10.1007/s11664-012-2091-9
- Shigetou, Akitsu;
- Suga, Tadatomo
- Article
10
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2243, doi. 10.1007/s11664-012-2092-8
- Article
11
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2029, doi. 10.1007/s11664-012-2065-y
- Fortier, Aleksandra;
- Kovacevic, Radovan
- Article
12
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2057, doi. 10.1007/s11664-012-2086-6
- Roshanghias, A.;
- Kokabi, A.;
- Miyashita, Y.;
- Mutoh, Y.;
- Ihara, I.;
- Guan Fatt, R.;
- Madaah-Hosseini, H.
- Article
13
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2281, doi. 10.1007/s11664-012-2037-2
- Zhang, Yi-He;
- Yu, Li;
- Zhao, Li-Hang;
- Tong, Wang-Shu;
- Huang, Hai-Tao;
- Ke, Shan-Ming;
- Chan, H.
- Article
14
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2197, doi. 10.1007/s11664-012-2115-5
- Chen, Fa-Hsyang;
- Pan, Tung-Ming
- Article
15
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2169, doi. 10.1007/s11664-012-2103-9
- Birkett, Martin;
- Penlington, Roger
- Article
16
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2126, doi. 10.1007/s11664-012-2108-4
- Article
17
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2065, doi. 10.1007/s11664-012-2111-9
- Dadda, Jayaram;
- Müller, Eckhard;
- Klobes, Benedikt;
- Bauer Pereira, Paula;
- Hermann, Raphael
- Article
18
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2107, doi. 10.1007/s11664-012-2114-6
- Chidambaram, Vivek;
- Yeung, Ho;
- Shan, Gao
- Article
19
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2184, doi. 10.1007/s11664-012-2116-4
- Karmakar, Supriya;
- Chandy, John;
- Gogna, Mukesh;
- Jain, Faquir
- Article
20
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2204, doi. 10.1007/s11664-012-2112-8
- Jiang, Feng;
- Shen, Honglie;
- Wang, Wei
- Article
21
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2256, doi. 10.1007/s11664-012-2107-5
- Chidambaram, Vivek;
- Yeung, Ho;
- Shan, Gao
- Article
22
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2232, doi. 10.1007/s11664-012-2118-2
- Li, Fang;
- Zhang, Wanli;
- Peng, Bin;
- Zhang, Wenxu
- Article
23
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2162, doi. 10.1007/s11664-012-2125-3
- Kathalingam, A.;
- Rhee, Jin-Koo
- Article
24
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2073, doi. 10.1007/s11664-012-2135-1
- Shnawah, Dhafer;
- Said, Suhana;
- Sabri, Mohd;
- Badruddin, Irfan;
- Hoe, Teh;
- Che, Fa;
- Abood, Adnan
- Article
25
- 2012
- Sun, Ting;
- Hng, Huey;
- Yan, Qingyu;
- Ma, Jan
- Correction Notice
26
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2178, doi. 10.1007/s11664-012-2119-1
- Cheng, Weiming;
- Dai, Yifan;
- Hu, Hao;
- Cheng, Xiaomin;
- Miao, Xiangshui
- Article
27
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2045, doi. 10.1007/s11664-012-2131-5
- Liu, Jibin;
- Zhou, Wei;
- Liu, Lijuan;
- Wu, Ping
- Article
28
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2250, doi. 10.1007/s11664-012-2027-4
- Boujelben, Faiza;
- Khemakhem, H.;
- Simon, A.
- Article
29
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2145, doi. 10.1007/s11664-012-2136-0
- Jeon, Joon-Woo;
- Seong, Tae-Yeon;
- Namgoong, Gon
- Article
30
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2155, doi. 10.1007/s11664-012-2127-1
- Sapkota, Gopal;
- Gryczynski, Karol;
- Mcdougald, Roy;
- Neogi, Arup;
- Philipose, U.
- Article
31
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2151, doi. 10.1007/s11664-012-2137-z
- Zhao, Kuaile;
- Wang, Shaoping;
- Shen, A.
- Article
32
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2216, doi. 10.1007/s11664-012-2138-y
- Shami, M.;
- Awan, M.S.;
- Anis-ur-Rehman, M.
- Article
33
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2130, doi. 10.1007/s11664-012-2144-0
- Wang, Lin;
- Hu, Weida;
- Chen, Xiaoshuang;
- Lu, Wei
- Article
34
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2193, doi. 10.1007/s11664-012-2133-3
- Ohtani, Noboru;
- Ushio, Shoji;
- Kaneko, Tadaaki;
- Aigo, Takashi;
- Katsuno, Masakazu;
- Fujimoto, Tatsuo;
- Ohashi, Wataru
- Article
35
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2083, doi. 10.1007/s11664-012-2124-4
- Jiang, Ling;
- Jiang, Hanqing;
- Chawla, Nikhilesh
- Article
36
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2118, doi. 10.1007/s11664-012-2139-x
- Liu, F.S.;
- Pan, L.C.;
- Ao, W.Q.;
- He, L.P.;
- Li, X.X.;
- Li, H.T.;
- Li, J.
- Article
37
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2267, doi. 10.1007/s11664-012-2128-0
- Huang, Chen-Hung;
- Lin, Jia-Horng;
- Yang, Ruey-Bin;
- Lin, Ching-Wen;
- Lou, Ching-Wen
- Article
38
- Journal of Electronic Materials, 2012, v. 41, n. 8, p. 2139, doi. 10.1007/s11664-012-2150-2
- Wong, Yuen-Yee;
- Huang, Wei-Ching;
- Trinh, Hai-Dang;
- Yang, Tsung-Hsi;
- Chang, Jet-Rung;
- Chen, Micheal;
- Chang, Edward
- Article
39
- 2012
- Jeon, Joon-Woo;
- Seong, Tae-Yeon;
- Namkoong, Gon
- Correction Notice