Works matching IS 03615235 AND DT 2012 AND VI 41 AND IP 6
1
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1354, doi. 10.1007/s11664-012-1940-x
- Yim, Ju-Hyuk;
- Park, Hyung-Ho;
- Jang, Ho;
- Yoo, Myong-Jae;
- Paik, Dong-Su;
- Baek, SeungHyub;
- Kim, Jin-Sang
- Article
2
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1564, doi. 10.1007/s11664-012-1987-8
- Chen, Xi;
- Weathers, Annie;
- Moore, Arden;
- Zhou, Jianshi;
- Shi, Li
- Article
3
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1675, doi. 10.1007/s11664-011-1786-7
- You, Sin-Wook;
- Park, Kwan-Ho;
- Kim, Il-Ho;
- Choi, Soon-Mok;
- Seo, Won-Seon;
- Kim, Sun-Uk
- Article
4
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1138, doi. 10.1007/s11664-011-1790-y
- Ma, Yi;
- Wijesekara, Waruna;
- Palmqvist, Anders
- Article
5
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1199, doi. 10.1007/s11664-011-1788-5
- Boona, Stephen;
- Morelli, Donald
- Article
6
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 993, doi. 10.1007/s11664-011-1814-7
- Rodríguez, A.;
- Astrain, D.;
- Martínez, A.;
- Vián, J.G.
- Article
7
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1286, doi. 10.1007/s11664-011-1826-3
- Schmidt, M.;
- Schneider, G.;
- Heyn, Ch.;
- Stemmann, A.;
- Hansen, W.
- Article
8
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 977, doi. 10.1007/s11664-011-1833-4
- Wee, Daehyun;
- Kozinsky, Boris;
- Pavan, Barbara;
- Fornari, Marco
- Article
9
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1030, doi. 10.1007/s11664-011-1831-6
- Zhou, Chen;
- Sakamoto, Jeffery;
- Morelli, Donald
- Article
10
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 984, doi. 10.1007/s11664-011-1834-3
- Settaluri, Krishna;
- Lo, Hsinyi;
- Ram, Rajeev
- Article
11
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1662, doi. 10.1007/s11664-011-1846-z
- Sankar, Cheriyedath;
- Bangarigadu-Sanasy, Savitree;
- Kleinke, Holger
- Article
12
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1130, doi. 10.1007/s11664-011-1842-3
- Suekuni, Koichiro;
- Kunii, Masaru;
- Nishiate, Hirotaka;
- Ohta, Michihiro;
- Yamamoto, Atsushi;
- Koyano, Mikio
- Article
13
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1389, doi. 10.1007/s11664-011-1843-2
- Ponnambalam, V.;
- Morelli, Donald
- Article
14
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1011, doi. 10.1007/s11664-011-1839-y
- Article
15
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1450, doi. 10.1007/s11664-011-1844-1
- Liu, Guo;
- Lu, Qingmei;
- Zhang, Xin;
- Zhang, Jiuxing;
- Shi, Yongjun
- Article
16
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1648, doi. 10.1007/s11664-011-1861-0
- Orovets, Christine;
- Chamoire, Audrey;
- Jin, Hyungyu;
- Wiendlocha, Bartlomiej;
- Heremans, Joseph
- Article
17
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1579, doi. 10.1007/s11664-011-1845-0
- Wu, Chun-I;
- Todorov, Ilyia;
- Kanatzidis, Mercouri;
- Timm, Edward;
- Case, Eldon;
- Schock, Harold;
- Hogan, Timothy
- Article
18
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1317, doi. 10.1007/s11664-011-1849-9
- Koyano, Mikio;
- Tanaka, Junya;
- Suekuni, Koichiro;
- Ariga, Tomoki
- Article
19
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1120, doi. 10.1007/s11664-011-1841-4
- Duan, Bo;
- Zhai, Pengcheng;
- Liu, Lisheng;
- Zhang, Qingjie
- Article
20
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1456, doi. 10.1007/s11664-011-1859-7
- Article
21
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1280, doi. 10.1007/s11664-011-1848-x
- Nong, Ngo;
- Samson, Alfred;
- Pryds, Nini;
- Linderoth, Søren
- Article
22
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1606, doi. 10.1007/s11664-011-1851-2
- Vogel-Schäuble, Nina;
- Dujardin, Raphaël;
- Weidenkaff, Anke;
- Aguirre, Myriam
- Article
23
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1153, doi. 10.1007/s11664-011-1853-0
- Ni, Jennifer;
- Case, Eldon;
- Stewart, Ryan;
- Wu, Chun-I.;
- Hogan, Timothy;
- Kanatzidis, Mercouri
- Article
24
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 999, doi. 10.1007/s11664-011-1838-z
- Lertsatitthanakorn, C.;
- Rungsiyopas, M.;
- Therdyothin, A.;
- Soponronnarit, S.
- Article
25
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1559, doi. 10.1007/s11664-011-1860-1
- Suzuki, T.;
- Sakai, H.;
- Taguchi, Y.;
- Tokura, Y.
- Article
26
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1322, doi. 10.1007/s11664-011-1854-z
- Winkler, M.;
- Liu, X.;
- König, J.;
- Kirste, L.;
- Böttner, H.;
- Bensch, W.;
- Kienle, L.
- Article
27
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1535, doi. 10.1007/s11664-011-1850-3
- Hirayama, Naomi;
- Endo, Akira;
- Fujita, Kazuhiro;
- Hasegawa, Yasuhiro;
- Hatano, Naomichi;
- Nakamura, Hiroaki;
- Shirasaki, Ryōen;
- Yonemitsu, Kenji
- Article
28
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1020, doi. 10.1007/s11664-011-1856-x
- Trujillo, J.;
- Kim, J.;
- Lan, E.;
- Sharratt, S.;
- Ju, Y.;
- Dunn, B.
- Article
29
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1348, doi. 10.1007/s11664-011-1862-z
- Terazawa, Yuichi;
- Mikami, Masashi;
- Itoh, Takashi;
- Takeuchi, Tsunehiro
- Article
30
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1370, doi. 10.1007/s11664-011-1858-8
- Banan Sadeghian, Ramin;
- Bahk, Je-Hyeong;
- Bian, Zhixi;
- Shakouri, Ali
- Article
31
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1332, doi. 10.1007/s11664-011-1872-x
- Article
32
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1493, doi. 10.1007/s11664-011-1870-z
- Aabdin, Z.;
- Peranio, N.;
- Winkler, M.;
- Bessas, D.;
- König, J.;
- Hermann, R.;
- Böttner, H.;
- Eibl, O.
- Article
33
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1554, doi. 10.1007/s11664-011-1873-9
- Article
34
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1365, doi. 10.1007/s11664-011-1869-5
- Li, Zong-Yue;
- Li, Jing-Feng
- Article
35
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1004, doi. 10.1007/s11664-011-1871-y
- Choi, Soon-Mok;
- Kim, Kyoung-Hun;
- Jeong, Seong-Min;
- Choi, Hyoung-Seuk;
- Lim, Young;
- Seo, Won-Seon;
- Kim, Il-Ho
- Article
36
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1247, doi. 10.1007/s11664-011-1868-6
- Lim, Chang-Hyun;
- Choi, Soon-Mok;
- Seo, Won-Seon;
- Park, Hyung-Ho
- Article
37
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1170, doi. 10.1007/s11664-011-1857-9
- We, Ju;
- Lee, Heon;
- Gim, Sun;
- Kim, Gyung;
- Kim, Kukjoo;
- Choi, Kyung;
- Sul, Onejae;
- Cho, Byung
- Article
38
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1181, doi. 10.1007/s11664-011-1866-8
- Chubilleau, C.;
- Lenoir, B.;
- Masschelein, P.;
- Dauscher, A.;
- Godart, C.
- Article
39
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1274, doi. 10.1007/s11664-011-1847-y
- McCarty, R.;
- Thompson, J.;
- Sharp, J.;
- Thompson, A.;
- Bierschenk, J.
- Article
40
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1242, doi. 10.1007/s11664-011-1884-6
- Park, Jungyong;
- Kim, Shiho
- Article
41
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1125, doi. 10.1007/s11664-011-1883-7
- Article
42
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1481, doi. 10.1007/s11664-011-1885-5
- Madan, Deepa;
- Chen, Alic;
- Wright, Paul;
- Evans, James
- Article
43
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1227, doi. 10.1007/s11664-011-1895-3
- Kashi, S.;
- Keshavarz, M.;
- Vasilevskiy, D.;
- Masut, R.;
- Turenne, S.
- Article
44
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1298, doi. 10.1007/s11664-011-1887-3
- Rezania, A.;
- Rosendahl, L.
- Article
45
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1205, doi. 10.1007/s11664-011-1877-5
- Kawahara, Toshio;
- Emoto, Masahiko;
- Hamabe, Makoto;
- Watanabe, Hirofumi;
- Ivanov, Yury;
- Sun, Jian;
- Yamaguchi, Satarou
- Article
46
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1210, doi. 10.1007/s11664-011-1879-3
- Schmidt, Robert;
- Case, Eldon;
- Giles, Jesse;
- Ni, Jennifer;
- Hogan, Timothy
- Article
47
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1147, doi. 10.1007/s11664-011-1890-8
- Tan, G.;
- Wang, S.;
- Yan, Y.;
- Li, H.;
- Tang, X.
- Article
48
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1222, doi. 10.1007/s11664-011-1886-4
- Du, Z.;
- Jiang, G.;
- Chen, Y.;
- Gao, H.;
- Zhu, T.;
- Zhao, X.
- Article
49
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1051, doi. 10.1007/s11664-011-1889-1
- Park, Kwan-Ho;
- You, Sin-Wook;
- Ur, Soon-Chul;
- Kim, Il-Ho;
- Choi, Soon-Mok;
- Seo, Won-Seon
- Article
50
- Journal of Electronic Materials, 2012, v. 41, n. 6, p. 1177, doi. 10.1007/s11664-011-1898-0
- Xu, Jingtao;
- Wu, Jiazhen;
- Heguri, Satoshi;
- Mu, Gang;
- Tanabe, Yoichi;
- Tanigaki, Katsumi
- Article