Works matching IS 03615235 AND DT 2012 AND VI 41 AND IP 5


Results: 28
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    Growth Studies on Quaternary AlInGaN Layers for HEMT Application.

    Published in:
    Journal of Electronic Materials, 2012, v. 41, n. 5, p. 905, doi. 10.1007/s11664-012-1989-6
    By:
    • Reuters, Benjamin;
    • Wille, A.;
    • Holländer, B.;
    • Sakalauskas, E.;
    • Ketteniss, N.;
    • Mauder, C.;
    • Goldhahn, R.;
    • Heuken, M.;
    • Kalisch, H.;
    • Vescan, A.
    Publication type:
    Article
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    LaAlO/SrTiO Epitaxial Heterostructures by Atomic Layer Deposition.

    Published in:
    Journal of Electronic Materials, 2012, v. 41, n. 5, p. 819, doi. 10.1007/s11664-012-1960-6
    By:
    • Sbrockey, Nick;
    • Luong, Michael;
    • Gallo, Eric;
    • Sloppy, Jennifer;
    • Chen, Guannan;
    • Winkler, Christopher;
    • Johnson, Stephanie;
    • Taheri, Mitra;
    • Tompa, Gary;
    • Spanier, Jonathan
    Publication type:
    Article
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    Atom Probe Tomography of Zinc Oxide Nanowires.

    Published in:
    Journal of Electronic Materials, 2012, v. 41, n. 5, p. 801, doi. 10.1007/s11664-011-1803-x
    By:
    • Dawahre, Nabil;
    • Shen, Gang;
    • Balci, Soner;
    • Baughman, William;
    • Wilbert, David;
    • Harris, Nick;
    • Butler, Lee;
    • Martens, Rich;
    • Kim, Seongsin;
    • Kung, Patrick
    Publication type:
    Article
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