Works matching IS 03615235 AND DT 2012 AND VI 41 AND IP 5
1
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 971, doi. 10.1007/s11664-012-2094-6
- Norris, Kate;
- Lohn, Andrew;
- Onishi, Takehiro;
- Coleman, Elane;
- Wong, Vernon;
- Shakouri, Ali;
- Tompa, Gary;
- Kobayashi, Nobuhiko
- Article
2
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 954, doi. 10.1007/s11664-012-2078-6
- Takamura, Yota;
- Hayashi, Kengo;
- Shuto, Yusuke;
- Sugahara, Satoshi
- Article
3
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 944, doi. 10.1007/s11664-012-2082-x
- Moug, R.T.;
- Sultana, H.;
- Yao, Y.;
- Alfaro-Martinez, A.;
- Peng, L.;
- Garcia, T.;
- Shen, A.;
- Gmachl, C.;
- Tamargo, M.C.
- Article
4
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 928, doi. 10.1007/s11664-012-2081-y
- Shemeya, Corey;
- Vandervelde, Thomas
- Article
5
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 948, doi. 10.1007/s11664-012-2050-5
- Burke, Peter;
- Buehl, Trevor;
- Gilles, Pernot;
- Lu, Hong;
- Shakouri, Ali;
- Palmstrom, Chris;
- Bowers, John;
- Gossard, Arthur
- Article
6
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 921, doi. 10.1007/s11664-012-2046-1
- Oloniyo, Olubukun;
- Kumar, Senthil;
- Scott, Keith
- Article
7
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 959, doi. 10.1007/s11664-012-2071-0
- Mueller, David;
- Roberts, Denzil;
- Triplett, Gregory
- Article
8
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 935, doi. 10.1007/s11664-012-2058-x
- Shin, Kyeong-Sik;
- Chui, Chi
- Article
9
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 830, doi. 10.1007/s11664-012-1996-7
- Bertani, Paul;
- Wen, Xuejin;
- Lu, Wu
- Article
10
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 845, doi. 10.1007/s11664-012-2020-y
- Julian, Nick;
- Mages, Phil;
- Zhang, Chong;
- Zhang, Jack;
- Kraemer, Stephan;
- Stemmer, Susanne;
- Denbaars, Steven;
- Coldren, Larry;
- Petroff, Pierre;
- Bowers, John
- Article
11
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 837, doi. 10.1007/s11664-012-2011-z
- Bhatia, A.;
- Hlaing Oo, W.M.;
- Siegel, G.;
- Stone, P.R.;
- Yu, K.M.;
- Scarpulla, M.A.
- Article
12
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 905, doi. 10.1007/s11664-012-1989-6
- Reuters, Benjamin;
- Wille, A.;
- Holländer, B.;
- Sakalauskas, E.;
- Ketteniss, N.;
- Mauder, C.;
- Goldhahn, R.;
- Heuken, M.;
- Kalisch, H.;
- Vescan, A.
- Article
13
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 910, doi. 10.1007/s11664-012-2000-2
- Cheng, Lin;
- Agarwal, Anant;
- Dhar, Sarit;
- Ryu, Sei-Hyung;
- Palmour, John
- Article
14
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 813, doi. 10.1007/s11664-012-1951-7
- Zevalkink, Alex;
- Swallow, Jessica;
- Snyder, G.
- Article
15
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 899, doi. 10.1007/s11664-012-1956-2
- Jung, Seungyong;
- Kipshidze, Gela;
- Liang, Rui;
- Suchalkin, Sergey;
- Shterengas, Leon;
- Belenky, Gregory
- Article
16
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 857, doi. 10.1007/s11664-012-1977-x
- Lal, Shalini;
- Snow, Eric;
- Lu, Jing;
- Swenson, Brian;
- Keller, Stacia;
- Denbaars, Steven;
- Mishra, Umesh
- Article
17
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 824, doi. 10.1007/s11664-012-1967-z
- Uddin, Md;
- Pandikunta, Mahesh;
- Mansurov, Vladimir;
- Sohal, Sandeep;
- Myasishchev, Denis;
- Guryanov, Georgiy;
- Kuryatkov, Vladimir;
- Holtz, Mark;
- Nikishin, Sergey
- Article
18
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 819, doi. 10.1007/s11664-012-1960-6
- Sbrockey, Nick;
- Luong, Michael;
- Gallo, Eric;
- Sloppy, Jennifer;
- Chen, Guannan;
- Winkler, Christopher;
- Johnson, Stephanie;
- Taheri, Mitra;
- Tompa, Gary;
- Spanier, Jonathan
- Article
19
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 895, doi. 10.1007/s11664-012-1905-0
- Lee, Chen-Guan;
- Dodabalapur, Ananth
- Article
20
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 965, doi. 10.1007/s11664-012-1920-1
- Warde, Elias;
- Sakr, Salam;
- Tchernycheva, Maria;
- Julien, Francois
- Article
21
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 887, doi. 10.1007/s11664-012-1904-1
- Curtin, Benjamin;
- Fang, Eugene;
- Bowers, John
- Article
22
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 853, doi. 10.1007/s11664-012-1919-7
- Jha, S.;
- Wang, C.D.;
- Luan, C.Y.;
- Liu, C.P.;
- Bin, H.;
- Kutsay, O.;
- Bello, I.;
- Zapien, J.A.;
- Zhang, W.J.;
- Lee, S.T.
- Article
23
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 881, doi. 10.1007/s11664-011-1881-9
- Edmunds, C.;
- Tang, L.;
- Li, D.;
- Cervantes, M.;
- Gardner, G.;
- Paskova, T.;
- Manfra, M.;
- Malis, O.
- Article
24
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 873, doi. 10.1007/s11664-011-1867-7
- Huang, C.-C.;
- Mason, A.D.;
- Conley, J.F.;
- Heist, C.;
- Koesdjojo, M.T.;
- Remcho, V.T.;
- Afentakis, T.
- Article
25
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 865, doi. 10.1007/s11664-011-1852-1
- Gagnon, Jarod;
- Tungare, Mihir;
- Weng, Xiaojun;
- Leathersich, Jeffrey;
- Shahedipour-Sandvik, Fatemeh;
- Redwing, Joan
- Article
26
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 809, doi. 10.1007/s11664-011-1824-5
- Gutsche, C.;
- Lysov, A.;
- Regolin, I.;
- Münstermann, B.;
- Prost, W.;
- Tegude, F.
- Article
27
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 801, doi. 10.1007/s11664-011-1803-x
- Dawahre, Nabil;
- Shen, Gang;
- Balci, Soner;
- Baughman, William;
- Wilbert, David;
- Harris, Nick;
- Butler, Lee;
- Martens, Rich;
- Kim, Seongsin;
- Kung, Patrick
- Article
28
- Journal of Electronic Materials, 2012, v. 41, n. 5, p. 915, doi. 10.1007/s11664-011-1792-9
- Article