Works matching IS 03615235 AND DT 2012 AND VI 41 AND IP 3
1
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 506, doi. 10.1007/s11664-011-1793-8
- Cheng, Liwei;
- Fan, Jenyu;
- Janssen, Douglas;
- Guo, Dingkai;
- Chen, Xing;
- Towner, Fred;
- Choa, Fow-Sen
- Article
2
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 514, doi. 10.1007/s11664-011-1795-6
- Chen, Shibin;
- Li, Dichen;
- Tian, Xiaoyong;
- Han, Haoxue;
- Wu, Haihua
- Article
3
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 611, doi. 10.1007/s11664-011-1799-2
- Hannigan, K.;
- Reid, M.;
- Collins, M.N.;
- Dalton, E.;
- Xu, C.;
- Wright, B.;
- Demirkan, K.;
- Opila, R.L.;
- Reents, W.D.;
- Franey, J.P.;
- Fleming, D.A.;
- Punch, J.
- Article
4
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 466, doi. 10.1007/s11664-011-1798-3
- Wang, H.;
- Li, S.L.;
- Xiong, H.;
- Wu, Z.H.;
- Dai, J.N.;
- Tian, Y.;
- Fang, Y.-Y.;
- Chen, C.Q.
- Article
5
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 457, doi. 10.1007/s11664-011-1794-7
- Nipoti, R.;
- Nath, A.;
- Qadri, S.B.;
- Tian, Y-L.;
- Albonetti, C.;
- Carnera, A.;
- Rao, Mulpuri
- Article
6
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 552, doi. 10.1007/s11664-011-1801-z
- Gao, Yuan-Wen;
- Jia, Xiao-Dong
- Article
7
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 488, doi. 10.1007/s11664-011-1802-y
- Gul, R.;
- Keeter, K.;
- Rodriguez, R.;
- Bolotnikov, A.E.;
- Hossain, A.;
- Camarda, G.S.;
- Kim, K.H.;
- Yang, G.;
- Cui, Y.;
- Carcelen, V.;
- Franc, J.;
- Li, Z.;
- James, R.B.
- Article
8
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 431, doi. 10.1007/s11664-011-1783-x
- Song, Jizhong;
- He, Ying;
- Chen, Jie;
- Zhu, Di;
- Pan, Zhaodong;
- Zhang, Yaofei;
- Wang, Jun-an
- Article
9
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 560, doi. 10.1007/s11664-011-1813-8
- Sarius, N.;
- Lauridsen, J.;
- Lewin, E.;
- Jansson, U.;
- Högberg, H.;
- Öberg, Å.;
- Sarova, G.;
- Staperfeld, G.;
- Leisner, P.;
- Eklund, P.;
- Hultman, L.
- Article
10
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 494, doi. 10.1007/s11664-011-1807-6
- Shahrjerdi, D.;
- Hekmatshoar, B.;
- Bedell, S.;
- Hopstaken, M.;
- Sadana, D.
- Article
11
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 519, doi. 10.1007/s11664-011-1800-0
- Sun, Youyi;
- Tian, Ye;
- He, Minghong;
- Zhao, Qing;
- Chen, Chuang;
- Hu, Changsheng;
- Liu, Yaqing
- Article
12
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 524, doi. 10.1007/s11664-011-1815-6
- Biswas, Sushmita;
- Gosztola, David;
- Wiederrecht, Gary;
- Stroscio, Michael;
- Dutta, Mitra
- Article
13
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 498, doi. 10.1007/s11664-011-1809-4
- Massoudi, I.;
- Habchi, M.M.;
- Rebey, A.;
- El Jani, B.
- Article
14
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 437, doi. 10.1007/s11664-011-1810-y
- Lin, Yen-Sheng;
- Tseng, Wei-Chih
- Article
15
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 546, doi. 10.1007/s11664-011-1819-2
- Li, Y.M.;
- Shen, Z.Y.;
- Jiang, L.;
- Liao, R.H.;
- Wang, Z.M.;
- Hong, Y.
- Article
16
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 451, doi. 10.1007/s11664-011-1823-6
- Kuo, Dong-Hau;
- He, Jheng-Yu;
- Huang, Ying-Sheng
- Article
17
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 596, doi. 10.1007/s11664-011-1812-9
- Tucker, J.P.;
- Chan, D.K.;
- Subbarayan, G.;
- Handwerker, C.A.
- Article
18
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 480, doi. 10.1007/s11664-011-1827-2
- Lotfi, S.;
- Li, L.-G.;
- Vallin, Ö.;
- Norström, H.;
- Olsson, J.
- Article
19
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 540, doi. 10.1007/s11664-011-1828-1
- Singh, Devinder;
- Singh, Rajinder
- Article
20
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 580, doi. 10.1007/s11664-011-1830-7
- Kanda, Yoshihiko;
- Kariya, Yoshiharu;
- Oto, Yuji
- Article
21
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 588, doi. 10.1007/s11664-011-1829-0
- Jadhav, Nitin;
- Wasserman, Jacob;
- Pei, Fei;
- Chason, Eric
- Article
22
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 442, doi. 10.1007/s11664-011-1835-2
- Lin, Y.;
- Yen, W.;
- Shen, C.;
- Yao, P.
- Article
23
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 624, doi. 10.1007/s11664-011-1832-5
- Article
24
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 573, doi. 10.1007/s11664-011-1836-1
- Ladani, Leila;
- Razmi, Jafar
- Article
25
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 535, doi. 10.1007/s11664-011-1840-5
- Article
26
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 568, doi. 10.1007/s11664-011-1855-y
- Pete, D.J.;
- Helonde, J.B.;
- Vairagar, A.V.;
- Mhaisalkar, S.G.
- Article
27
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 476, doi. 10.1007/s11664-011-1863-y
- Article
28
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 471, doi. 10.1007/s11664-011-1864-x
- Chen, Y.;
- Jiang, Y.;
- Xu, P.Q.;
- Ma, Z.G.;
- Wang, X.L.;
- He, T.;
- Peng, M.Z.;
- Luo, W.J.;
- Liu, X.Y.;
- Wang, L.;
- Jia, H.Q.;
- Chen, H.
- Article
29
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 530, doi. 10.1007/s11664-011-1874-8
- Xing, Yun;
- Myers, Joshua;
- Obi, Ogheneyunume;
- Sun, Nian;
- Zhuang, Yan
- Article