Works matching IS 03615235 AND DT 2012 AND VI 41 AND IP 3
Results: 29
Analysis of InP Regrowth on Deep-Etched Mesas and Structural Characterization for Buried-Heterostructure Quantum Cascade Lasers.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 506, doi. 10.1007/s11664-011-1793-8
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Study on the Microwave Transmission Characteristics of a Three-Dimensional Electromagnetic Bandgap Structure with Coupled Defects.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 514, doi. 10.1007/s11664-011-1795-6
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Corrosion of RoHS-Compliant Surface Finishes in Corrosive Mixed Flowing Gas Environments.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 611, doi. 10.1007/s11664-011-1799-2
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The Effect of AlN Nucleation Temperature on the Growth of AlN Films via Metalorganic Chemical Vapor Deposition.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 466, doi. 10.1007/s11664-011-1798-3
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High-Dose Phosphorus-Implanted 4H-SiC: Microwave and Conventional Post-Implantation Annealing at Temperatures ≥1700°C.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 457, doi. 10.1007/s11664-011-1794-7
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Thermoelectric Properties of Polycrystalline Thin Films Under an External Magnetic Field.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 552, doi. 10.1007/s11664-011-1801-z
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Point Defects in Pb-, Bi-, and In-Doped CdZnTe Detectors: Deep-Level Transient Spectroscopy (DLTS) Measurements.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 488, doi. 10.1007/s11664-011-1802-y
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Bicolor Light-Emitting Diode Based on Zinc Oxide Nanorod Arrays and Poly(2-methoxy,5-octoxy)-1,4-phenylenevinylene.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 431, doi. 10.1007/s11664-011-1783-x
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Contact Resistance of Ti-Si-C-Ag and Ti-Si-C-Ag-Pd Nanocomposite Coatings.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 560, doi. 10.1007/s11664-011-1813-8
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Low-Temperature Epitaxy of Compressively Strained Silicon Directly on Silicon Substrates.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 494, doi. 10.1007/s11664-011-1807-6
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Controlled Synthesis of FeO/Ag Core-Shell Composite Nanoparticles with High Electrical Conductivity.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 519, doi. 10.1007/s11664-011-1800-0
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Annealing-Induced Morphological Changes in Nanocrystalline Quantum Dots and Their Impact on Charge Transport Properties.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 524, doi. 10.1007/s11664-011-1815-6
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In Situ Spectral Reflectance Investigation of InAs/GaAs Heterostructures Grown by MOVPE.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 498, doi. 10.1007/s11664-011-1809-4
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Effect of Al Nanoparticles on the Microstructure, Electrical, and Optical Properties of AZO/Al/AZO Trilayer Thin Film.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 437, doi. 10.1007/s11664-011-1810-y
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Microstructure, Phase Transition, and Electrical Properties of KNaNbO Lead-Free Piezoceramics.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 546, doi. 10.1007/s11664-011-1819-2
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Synthesis of Vertically Aligned ZnO Nanorods on Ni-Based Buffer Layers Using a Thermal Evaporation Process.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 451, doi. 10.1007/s11664-011-1823-6
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Constitutive Behavior of Mixed Sn-Pb/Sn-3.0Ag-0.5Cu Solder Alloys.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 596, doi. 10.1007/s11664-011-1812-9
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Fabrication and Characterization of 150-mm Silicon-on-Polycrystalline Silicon Carbide Substrates.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 480, doi. 10.1007/s11664-011-1827-2
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Study of Structural, Electrical, and Magnetic Properties of Layered Perovskite Oxides LnSrTiFeO (Ln = Nd, Gd).
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 540, doi. 10.1007/s11664-011-1828-1
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Influence of Cyclic Strain-Hardening Exponent on Fatigue Ductility Exponent for a Sn-Ag-Cu Micro-Solder Joint.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 580, doi. 10.1007/s11664-011-1830-7
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Stress Relaxation in Sn-Based Films: Effects of Pb Alloying, Grain Size, and Microstructure.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 588, doi. 10.1007/s11664-011-1829-0
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Surface Texturing of Ga-Doped ZnO Thin Films by Pulsed Direct-Current Magnetron Sputtering for Photovoltaic Applications.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 442, doi. 10.1007/s11664-011-1835-2
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Effects of Potential and Mechanical Stimulation on Oxidation of Tantalum During Electrochemical Mechanical Polishing.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 624, doi. 10.1007/s11664-011-1832-5
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Mechanical Strength and Failure Characterization of Sn-Ag-Cu Intermetallic Compound Joints at the Microscale.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 573, doi. 10.1007/s11664-011-1836-1
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Electronic and Lattice Vibrational Properties of Cubic SrHfO from First-Principles Calculations.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 535, doi. 10.1007/s11664-011-1840-5
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A Model for Understanding Electromigration-Induced Void Evolution in Dual-Inlaid Cu Interconnect Structures.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 568, doi. 10.1007/s11664-011-1855-y
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Thermoelectric Power and ZT in Conducting Organic Semiconductor.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 476, doi. 10.1007/s11664-011-1863-y
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Improvement of Breakdown Characteristics of a GaN HEMT with AlGaN Buffer Layer.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 471, doi. 10.1007/s11664-011-1864-x
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Scanning Microwave Microscopy Characterization of Spin-Spray-Deposited Ferrite/Nonmagnetic Films.
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- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 530, doi. 10.1007/s11664-011-1874-8
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