Works matching IS 03615235 AND DT 2011 AND VI 40 AND IP 8
Results: 41
High-Quality (211)B CdTe on (211)Si Substrates Using Metalorganic Vapor-Phase Epitaxy.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1790, doi. 10.1007/s11664-011-1586-0
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Effect of As Passivation on Vapor-Phase Epitaxial Growth of Ge on (211)Si as a Buffer Layer for CdTe Epitaxy.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1637, doi. 10.1007/s11664-011-1627-8
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Design and Modeling of HgCdTe nBn Detectors.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1624, doi. 10.1007/s11664-011-1614-0
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ZnO/ZnSe/ZnTe Heterojunctions for ZnTe-Based Solar Cells.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1674, doi. 10.1007/s11664-011-1641-x
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Low-Roughness Plasma Etching of HgCdTe Masked with Patterned Silicon Dioxide.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1642, doi. 10.1007/s11664-011-1633-x
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Study of HgCdSe Material Grown by Molecular Beam Epitaxy.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1679, doi. 10.1007/s11664-011-1643-8
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Optimization of Microlenses for InSb Infrared Focal-Plane Arrays.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1647, doi. 10.1007/s11664-011-1634-9
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Spectral Response Model of Backside-Illuminated HgCdTe Detectors.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1657, doi. 10.1007/s11664-011-1637-6
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Low-Pressure Chemical Vapor Deposition of CdS and Atomic Layer Deposition of CdTe Films for HgCdTe Surface Passivation.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1668, doi. 10.1007/s11664-011-1640-y
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Calculation of Auger Lifetimes in HgCdTe.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1663, doi. 10.1007/s11664-011-1638-5
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Large-Format HgCdTe Dual-Band Long-Wavelength Infrared Focal-Plane Arrays.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1630, doi. 10.1007/s11664-011-1626-9
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A 2D Full-Band Monte Carlo Study of HgCdTe-Based Avalanche Photodiodes.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1651, doi. 10.1007/s11664-011-1635-8
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Microstructure of Heteroepitaxial ZnTe Grown by Molecular Beam Epitaxy on Si(211) Substrates.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1860, doi. 10.1007/s11664-011-1648-3
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Three-Dimensional Electromagnetic and Electrical Simulation of HgCdTe Pixel Arrays.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1795, doi. 10.1007/s11664-011-1644-7
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Performance Comparison of Long-Wavelength Infrared Type II Superlattice Devices with HgCdTe.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1815, doi. 10.1007/s11664-011-1653-6
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Nonvolatile Memory Effect in Indium Gallium Arsenide-Based Metal-Oxide-Semiconductor Devices Using II-VI Tunnel Insulators.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1685, doi. 10.1007/s11664-011-1655-4
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Chemical Polishing of CdTe and CdZnTe in Iodine-Methanol Etching Solutions.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1802, doi. 10.1007/s11664-011-1649-2
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Si Wafer Thinning Techniques Compatible With Epitaxy of CdTe Buffer Layers.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1809, doi. 10.1007/s11664-011-1651-8
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Internal Electric Field Behavior of Cadmium Zinc Telluride Radiation Detectors Under High Carrier Injection.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1689, doi. 10.1007/s11664-011-1656-3
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Planar n-on- p HgCdTe FPAs for LWIR and VLWIR Applications.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1618, doi. 10.1007/s11664-011-1659-0
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Wet Etching of HgCdTe in Aqueous Bromine Solutions: a Quantitative Chemical Approach.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1823, doi. 10.1007/s11664-011-1660-7
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Molecular Beam Epitaxy Growth of HgCdTe on Large-Area Si and CdZnTe Substrates.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1706, doi. 10.1007/s11664-011-1665-2
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Core-Shell ZnCdSe/ZnCdSe Quantum Dots for Nonvolatile Memory and Electroluminescent Device Applications.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1699, doi. 10.1007/s11664-011-1663-4
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The Effects of Microvoid Defects on MWIR HgCdTe-Based Diodes.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1693, doi. 10.1007/s11664-011-1658-1
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Spatial Wavefunction-Switched (SWS) InGaAs FETs with II-VI Gate Insulators.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1717, doi. 10.1007/s11664-011-1667-0
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Dual-Color InAs/GaSb Superlattice Focal-Plane Array Technology.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1738, doi. 10.1007/s11664-011-1674-1
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Microstructural Characterization of CdTe(211)B/ZnTe/Si(211) Heterostructures Grown by Molecular Beam Epitaxy.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1733, doi. 10.1007/s11664-011-1673-2
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Dislocation Analysis in (112)B HgCdTe/CdTe/Si.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1847, doi. 10.1007/s11664-011-1670-5
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Foreword.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1613, doi. 10.1007/s11664-011-1678-x
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Effect of Cycle Annealing Parameters on Dislocation Density Reduction for HgCdTe on Si.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1727, doi. 10.1007/s11664-011-1669-y
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History-Dependent Impact Ionization Theory Applied to HgCdTe e-APDs.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1757, doi. 10.1007/s11664-011-1679-9
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Nonvolatile Silicon Memory Using GeO-Cladded Ge Quantum Dots Self-Assembled on SiO and Lattice-Matched II-VI Tunnel Insulator.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1769, doi. 10.1007/s11664-011-1685-y
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Three-State Quantum Dot Gate FETs Using ZnS-ZnMgS Lattice-Matched Gate Insulator on Silicon.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1749, doi. 10.1007/s11664-011-1676-z
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HgCdTe Quantum Detection: from Long-Wave IR down to UV.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1781, doi. 10.1007/s11664-011-1691-0
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The William E. Spicer-Thomas N. Casselman Award for Best Student Paper.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1615, doi. 10.1007/s11664-011-1677-y
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Effects of Varying MBE Growth Conditions on Layered Zn-Se-Te Structures.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1775, doi. 10.1007/s11664-011-1690-1
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Status of p-on- n Arsenic-Implanted HgCdTe Technologies.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1830, doi. 10.1007/s11664-011-1692-z
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CdZnTe Radiation Detectors with HgTe/HgCdTe Superlattice Contacts for Leakage Current Reduction.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1854, doi. 10.1007/s11664-011-1680-3
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The Effect of Various Detector Geometries on the Performance of CZT Using One Crystal.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1744, doi. 10.1007/s11664-011-1675-0
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Reduction of Dislocation Density in HgCdTe on Si by Producing Highly Reticulated Structures.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1785, doi. 10.1007/s11664-011-1697-7
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HgCdTe Photon Trapping Structure for Broadband Mid-Wavelength Infrared Absorption.
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- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1840, doi. 10.1007/s11664-011-1703-0
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