Works matching IS 03615235 AND DT 2011 AND VI 40 AND IP 6
1
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1377, doi. 10.1007/s11664-011-1520-5
- Goyal, R.;
- Jadhav, P.;
- Tiwari, A.
- Article
2
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1403, doi. 10.1007/s11664-010-1496-6
- Ventura, Tina;
- Cho, Young-Hee;
- Kong, Chun;
- Dahle, Arne
- Article
3
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1384, doi. 10.1007/s11664-011-1521-4
- Onishi, Takashi;
- Mizuno, Masao;
- Fujikawa, Takao;
- Yoshikawa, Tetsuya;
- Munemasa, Jun;
- Mizuno, Masataka;
- Kihara, Teruo;
- Araki, Hideki;
- Shirai, Yasuharu
- Article
4
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1470, doi. 10.1007/s11664-011-1522-3
- Lai, Ming-Hui;
- Sermon Wu, YewChung;
- Chang, Chih-Pang
- Article
5
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1409, doi. 10.1007/s11664-011-1534-z
- Nguyen, T.;
- Yu, D.;
- Park, S.
- Article
6
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1364, doi. 10.1007/s11664-011-1526-z
- Kapil, Atul;
- Chand, Subhash
- Article
7
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1428, doi. 10.1007/s11664-011-1539-7
- Amin, B.;
- Arif, S.;
- Ahmad, Iftikhar;
- Maqbool, M.;
- Ahmad, R.;
- Goumri-Said, S.;
- Prisbrey, K.
- Article
8
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1345, doi. 10.1007/s11664-011-1576-2
- Kuo, Dong-Hau;
- Chen, Yung-Chuan;
- He, Jheng-Yu;
- Chu, Jinn
- Article
9
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1369, doi. 10.1007/s11664-011-1535-y
- Zhang, Zili;
- Suo, Hongli;
- Ma, Lin;
- Liu, Min;
- Zhang, Teng;
- Zhou, Meiling
- Article
10
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1437, doi. 10.1007/s11664-011-1540-1
- Clayton, Andrew;
- Irvine, Stuart
- Article
11
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1416, doi. 10.1007/s11664-011-1577-1
- Ma, Limin;
- Tai, Feng;
- Xu, Guangchen;
- Guo, Fu;
- Wang, Xitao
- Article
12
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1394, doi. 10.1007/s11664-011-1594-0
- Alarifi, Hani;
- Hu, Anming;
- Yavuz, Mustafa;
- Zhou, Y.
- Article
13
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1422, doi. 10.1007/s11664-011-1592-2
- Danaher, F.;
- Williams, J.;
- Singh, D.;
- Jiang, L.;
- Chawla, N.
- Article
14
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1350, doi. 10.1007/s11664-011-1518-z
- Spencer, Todd;
- Chen, Yu-Chun;
- Saha, Rajarshi;
- Kohl, Paul
- Article
15
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1444, doi. 10.1007/s11664-011-1597-x
- Huang, Y.;
- Kim, H.;
- McCracken, M.;
- Viswanathan, G.;
- Pon, F.;
- Mayer, M.;
- Zhou, Y.
- Article
16
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1452, doi. 10.1007/s11664-011-1604-2
- Han, Qifeng;
- Liu, Qiang;
- Duan, Chenghong;
- Du, Guoping;
- Shi, Wangzhou
- Article
17
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1457, doi. 10.1007/s11664-011-1605-1
- Montgomery, K.;
- Allen, C.;
- Wildeson, I.;
- Jeon, J.-H.;
- Ramdas, A.;
- Woodall, J.
- Article
18
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1335, doi. 10.1007/s11664-011-1613-1
- Harris, J.;
- Graudejus, O.;
- Wagner, S.
- Article
19
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1461, doi. 10.1007/s11664-011-1608-y
- Medina-Montes, M.;
- Lee, S.;
- Pérez, M.;
- Baldenegro-Pérez, L.;
- Quevedo-López, M.;
- Gnade, B.;
- Ramírez-Bon, R.
- Article