Works matching IS 03615235 AND DT 2011 AND VI 40 AND IP 5
1
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 1042, doi. 10.1007/s11664-011-1527-y
- Liu, Chia-Jyi;
- Huang, Yu-Chih;
- Nong, N.;
- Liu, Yen-Liang;
- Petŕićek, V.
- Article
2
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 733, doi. 10.1007/s11664-011-1532-1
- Korzhuev, M.;
- Avilov, E.;
- Nichezina, I.
- Article
3
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 1150, doi. 10.1007/s11664-011-1559-3
- Wang, S.;
- Xie, W.;
- Li, H.;
- Tang, X.;
- Zhang, Q.
- Article
4
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 1254, doi. 10.1007/s11664-010-1357-3
- Article
5
- 2011
- Ravi, Vilupanur;
- Firdosy, Samad;
- Caillat, Thierry;
- Brandon, Erik;
- Walde, Keith;
- Maricic, Lina;
- Sayir, Ali
- Correction Notice
6
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 489, doi. 10.1007/s11664-010-1393-z
- Yang, Xuqiu;
- Liu, Lisheng;
- Zhang, Qingjie;
- Zhai, Pengcheng
- Article
7
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 493, doi. 10.1007/s11664-010-1400-4
- Article
8
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 499, doi. 10.1007/s11664-010-1402-2
- Wang, Ziyang;
- Andel, Yvonne;
- Jambunathan, Madhusudhanan;
- Leonov, Vladimir;
- Elfrink, Rene;
- Vullers, Ruud
- Article
9
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 903, doi. 10.1007/s11664-010-1405-z
- Salleh, Faiz;
- Ikeda, Hiroya
- Article
10
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 898, doi. 10.1007/s11664-010-1403-1
- Toshima, Naoki;
- Imai, Masahiro;
- Ichikawa, Shoko
- Article
11
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 1260, doi. 10.1007/s11664-010-1406-y
- Matsumoto, Tsuyoshi;
- Ichige, Yuki;
- Komine, Takashi;
- Sugita, Ryuji;
- Aono, Tomosuke;
- Murata, Masayuki;
- Nakamura, Daiki;
- Hasegawa, Yasuhiro
- Article
12
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 513, doi. 10.1007/s11664-010-1416-9
- Hurwitz, Elisa;
- Asghar, Muhammad;
- Melton, Andrew;
- Kucukgok, Bahadir;
- Su, Liqin;
- Orocz, Mateusz;
- Jamil, Muhammad;
- Lu, Na;
- Ferguson, Ian
- Article
13
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 504, doi. 10.1007/s11664-010-1412-0
- Tang, G.;
- Tang, C.;
- Xu, X.;
- He, Y.;
- Qiu, L.;
- Lv, L.;
- Wang, Z.;
- Du, Y.
- Article
14
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 907, doi. 10.1007/s11664-010-1409-8
- Brodowsky, Horst;
- Albus, Matthias;
- Chen, Qiyuan;
- Xiao, Zhongliang;
- Yin, Zhoulan
- Article
15
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 529, doi. 10.1007/s11664-010-1427-6
- Hirayama, Naomi;
- Endo, Akira;
- Fujita, Kazuhiro;
- Hasegawa, Yasuhiro;
- Hatano, Naomichi;
- Nakamura, Hiroaki;
- Shirasaki, Ryōen;
- Yonemitsu, Kenji
- Article
16
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 523, doi. 10.1007/s11664-010-1426-7
- Ichige, Yuki;
- Matsumoto, Tsuyoshi;
- Komine, Takashi;
- Sugita, Ryuji;
- Aono, Tomosuke;
- Murata, Masayuki;
- Nakamura, Daiki;
- Hasegawa, Yasuhiro
- Article
17
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 508, doi. 10.1007/s11664-010-1413-z
- Zhou, Tong;
- Lenoir, Bertrand;
- Christophe, Candolfi;
- Dauscher, Anne;
- Gall, Philippe;
- Gougeon, Patrick;
- Potel, Michel;
- Guilmeau, Emmanuel
- Article
18
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 518, doi. 10.1007/s11664-010-1424-9
- Du, Y.;
- Cai, K.;
- Li, H.;
- An, B.
- Article
19
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 533, doi. 10.1007/s11664-010-1435-6
- Article
20
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 920, doi. 10.1007/s11664-010-1437-4
- Article
21
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 547, doi. 10.1007/s11664-010-1444-5
- Zhou, Chen;
- Sakamoto, Jeffery;
- Morelli, Donald
- Article
22
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 557, doi. 10.1007/s11664-010-1450-7
- Ceresara, S.;
- Codecasa, M.;
- Passaretti, F.;
- Tomeš, P.;
- Weidenkaff, A.;
- Fanciulli, C.
- Article
23
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 551, doi. 10.1007/s11664-010-1446-3
- Choi, Soon-Mok;
- Lim, Chang-Hyun;
- Seo, Won-Seon
- Article
24
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 537, doi. 10.1007/s11664-010-1436-5
- Ohta, Michihiro;
- Hirai, Shinji;
- Kuzuya, Toshihiro
- Article
25
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 543, doi. 10.1007/s11664-010-1442-7
- Schmitz, Andreas;
- Stiewe, Christian;
- Müller, Eckhard
- Article
26
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 570, doi. 10.1007/s11664-010-1454-3
- Ballikaya, Sedat;
- Wang, Guoyu;
- Sun, Kai;
- Uher, Ctirad
- Article
27
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 561, doi. 10.1007/s11664-010-1451-6
- Article
28
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 926, doi. 10.1007/s11664-010-1452-5
- Shang, Peng-Peng;
- Zhang, Bo-Ping;
- Liu, Yong;
- Li, Jing-Feng;
- Zhu, Hong-Min
- Article
29
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 932, doi. 10.1007/s11664-010-1457-0
- Duan, Bo;
- Zhai, Pengcheng;
- Liu, Lisheng;
- Zhang, Qingjie
- Article
30
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 583, doi. 10.1007/s11664-010-1461-4
- Wunderlich, Wilfried;
- Motoyama, Yuichiro;
- Sugisawa, Yuta;
- Matsumura, Yoshihiro
- Article
31
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 937, doi. 10.1007/s11664-010-1462-3
- Fu, Hong;
- Ying, Pengzhan;
- Cui, Jiaolin;
- Yan, Yanming;
- Zhang, Xiaojun
- Article
32
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 962, doi. 10.1007/s11664-010-1469-9
- Park, Chan-Hyun;
- Kim, Yong-Sung
- Article
33
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 915, doi. 10.1007/s11664-010-1429-4
- Ohnishi, T.;
- Naito, M.;
- Mizusaki, S.;
- Nagata, Y.;
- Noro, Y.
- Article
34
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 942, doi. 10.1007/s11664-010-1463-2
- Chen, Chen;
- Liu, Da-Wei;
- Zhang, Bo-Ping;
- Li, Jing-Feng
- Article
35
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 589, doi. 10.1007/s11664-010-1464-1
- Yan, X.;
- Grytsiv, A.;
- Giester, G.;
- Bauer, E.;
- Rogl, P.;
- Paschen, S.
- Article
36
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 597, doi. 10.1007/s11664-010-1466-z
- Viennois, R.;
- Tao, X.;
- Jund, P.;
- Tedenac, J.-C.
- Article
37
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 953, doi. 10.1007/s11664-010-1467-y
- Article
38
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 606, doi. 10.1007/s11664-010-1473-0
- Article
39
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 967, doi. 10.1007/s11664-010-1471-2
- Yang, Tianqi;
- Xiao, Jinsheng;
- Li, Peng;
- Zhai, Pengcheng;
- Zhang, Qingjie
- Article
40
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 948, doi. 10.1007/s11664-010-1465-0
- Liu, Congcong;
- Jiang, Fengxing;
- Huang, Mingyu;
- Lu, Baoyang;
- Yue, Ruirui;
- Xu, Jingkun
- Article
41
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 992, doi. 10.1007/s11664-010-1476-x
- Liu, Da-Wei;
- Li, Jing-Feng;
- Chen, Chen;
- Zhang, Bo-Ping
- Article
42
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 624, doi. 10.1007/s11664-010-1484-x
- Wang, Hanfu;
- Chu, Weiguo;
- Wang, Dongwei;
- Mao, Weichen;
- Pan, Wenzhi;
- Guo, Yanjun;
- Xiong, Yufeng;
- Jin, Hao
- Article
43
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 577, doi. 10.1007/s11664-010-1458-z
- Bachmann, M.;
- Czerner, M.;
- Heiliger, C.
- Article
44
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 999, doi. 10.1007/s11664-010-1479-7
- Kim, Chang-eun;
- Kurosaki, Ken;
- Ishimaru, Manabu;
- Muta, Hiroaki;
- Yamanaka, Shinsuke
- Article
45
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 601, doi. 10.1007/s11664-010-1470-3
- Nakamura, Hiroaki;
- Hatano, Naomichi;
- Shirasaki, Ryōen;
- Hirayama, Naomi;
- Yonemitsu, Kenji
- Article
46
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 1010, doi. 10.1007/s11664-010-1485-9
- Yim, Ju-Hyuk;
- Jung, Kyooho;
- Kim, Hyo-Jung;
- Park, Hyung-Ho;
- Park, Chan;
- Kim, Jin-Sang
- Article
47
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 987, doi. 10.1007/s11664-010-1475-y
- Poopanya, P.;
- Yangthaisong, A.;
- Rattanapun, C.;
- Wichainchai, A.
- Article
48
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 974, doi. 10.1007/s11664-010-1472-1
- Zhou, An;
- Liu, Li-Sheng;
- Shu, Cui-Cui;
- Zhai, Peng-Cheng;
- Zhao, Wen-Yu;
- Zhang, Qing-Jie
- Article
49
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 980, doi. 10.1007/s11664-010-1474-z
- Zhang, J.;
- Qin, X.;
- Xin, H.;
- Li, D.;
- Song, C.
- Article
50
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 1005, doi. 10.1007/s11664-010-1480-1
- Hasegawa, Yasuhiro;
- Nakamura, Daiki;
- Murata, Masayuki;
- Yamamoto, Hiroya;
- Komine, Takashi;
- Taguchi, Takashi;
- Nakamura, Shinichiro
- Article