Works matching IS 03615235 AND DT 2010 AND VI 39 AND IP 9
1
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2122, doi. 10.1007/s11664-009-0990-1
- Uher, Ctirad;
- Li, Chang-Peng;
- Ballikaya, Sedat
- Article
2
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1897, doi. 10.1007/s11664-009-1060-4
- Article
3
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1566, doi. 10.1007/s11664-010-1285-2
- Lee, Kong Hoon;
- Kim, Hyunse;
- Kim, Ook Joong
- Article
4
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1554, doi. 10.1007/s11664-010-1273-6
- Dalili, Neda;
- He, Anqiang;
- Liu, Qi;
- Ivey, Douglas G.
- Article
5
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1572, doi. 10.1007/s11664-010-1277-2
- Nemoto, Takashi;
- Iida, Tsutomu;
- Sato, Junichi;
- Oguni, Yohei;
- Matsumoto, Atsunobu;
- Miyata, Takahiro;
- Sakamoto, Tatsuya;
- Nakajima, Tadao;
- Taguchi, Hirohisa;
- Nishio, Keishi;
- Takanashi, Yoshifumi
- Article
6
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1750, doi. 10.1007/s11664-010-1188-2
- Kwan-Ho Park;
- Jae-Yong Jung;
- Soon-Chul Ur;
- Il-Ho Kim
- Article
7
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1746, doi. 10.1007/s11664-010-1189-1
- Kristiansen, N. R.;
- Nielsen, H. K.
- Article
8
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1735, doi. 10.1007/s11664-010-1190-8
- Article
9
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1741, doi. 10.1007/s11664-010-1199-z
- Zhang, Y. H.;
- Xu, G. Y.;
- Han, F.;
- Wang, Z.;
- Ge, C. C.
- Article
10
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1730, doi. 10.1007/s11664-010-1204-6
- Tong, Y.;
- Yi, F. J.;
- Liu, L. S.;
- Zhang, Q. J.
- Article
11
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1724, doi. 10.1007/s11664-010-1179-3
- Zabrocki, K.;
- Müller, E.;
- Seifert, W.
- Article
12
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1714, doi. 10.1007/s11664-010-1203-7
- Xuqiu Yang;
- An Zhou;
- Lisheng Liu;
- Qingjie Zhang;
- Pengcheng Zhai
- Article
13
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1719, doi. 10.1007/s11664-010-1202-8
- Chen, Y.;
- Zhu, T. J.;
- Yang, S. H.;
- Zhang, S. N.;
- Miao, W.;
- Zhao, X. B.
- Article
14
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1708, doi. 10.1007/s11664-010-1155-y
- Sakamoto, Tatsuya;
- Iida, Tsutomu;
- Matsumoto, Atsunobu;
- Honda, Yasuhiko;
- Nemoto, Takashi;
- Sato, Junichi;
- Nakajima, Tadao;
- Taguchi, Hirohisa;
- Takanashi, Yoshifumi
- Article
15
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1422, doi. 10.1007/s11664-010-1322-1
- Stern, Yu.;
- Pavlova, L.;
- Mironov, R.
- Article
16
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1418, doi. 10.1007/s11664-010-1315-0
- Kambe, Mitsuru;
- Jinushi, Takahiro;
- Ishijima, Zenzo
- Article
17
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1408, doi. 10.1007/s11664-010-1325-y
- Rothe, K.;
- Stordeur, M.;
- Heyroth, F.;
- Syrowatka, F.;
- Leipner, H. S.
- Article
18
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1413, doi. 10.1007/s11664-010-1310-5
- Xin Zhang;
- Qing-mei Lu;
- Lei Wang;
- Fei-peng Zhang;
- Jiu-xing Zhang
- Article
19
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1399, doi. 10.1007/s11664-010-1319-9
- Anatychuk, L. I.;
- Strutynska, L. T.;
- Mykhailovsky, V. Ya
- Article
20
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1404, doi. 10.1007/s11664-010-1318-x
- Anatychuk, L. I.;
- Mykhailovsky, V. YA;
- Strutynska, L. T.
- Article
21
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1395, doi. 10.1007/s11664-010-1329-7
- Rothe, K.;
- Stordeur, M.;
- Leipner, H. S.
- Article
22
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1381, doi. 10.1007/s11664-010-1330-1
- Article
23
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1390, doi. 10.1007/s11664-010-1332-z
- Korzhuev, M. A.;
- Katin, I. V.
- Article
24
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1373, doi. 10.1007/s11664-010-1149-9
- Cox, Catherine A.;
- Brown, Shawna R.;
- Snyder, G.;
- Kauzlarich, Susan M.
- Article
25
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1386, doi. 10.1007/s11664-010-1312-3
- Nguyen, L. T. K.;
- Aydemir, U.;
- Baitinger, M.;
- Custers, J.;
- Haghighirad, A.;
- Höfler, R.;
- Luther, K. D.;
- Ritter, F.;
- Grin, Yu.;
- Assmus, W.;
- Paschen, S.
- Article
26
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1376, doi. 10.1007/s11664-010-1331-0
- Ebling, D.;
- Bartholomé, K.;
- Bartel, M.;
- Jägle, M.
- Article
27
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2079, doi. 10.1007/s11664-009-1006-x
- Golgovici, Florentina;
- Cojocaru, Anca;
- Nedelcu, Marin;
- Visan, Teodor
- Article
28
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2074, doi. 10.1007/s11664-009-1005-y
- Salzgeber, K.;
- Prenninger, P.;
- Grytsiv, A.;
- Rogl, P.;
- Bauer, E.
- Article
29
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2039, doi. 10.1007/s11664-009-1011-0
- Candolfi, C.;
- Aydemir, U.;
- Baitinger, M.;
- Oeschler, N.;
- Steglich, F.;
- Grin, Yu.
- Article
30
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2034, doi. 10.1007/s11664-009-1010-1
- Wojciechowski, K. T.;
- Schmidt, M.;
- Zybala, R.;
- Merkisz, J.;
- Fuć, P.;
- Lijewski, P.
- Article
31
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2049, doi. 10.1007/s11664-009-1012-z
- Gelbstein, Yaniv;
- Dado, Boaz;
- Ben-Yehuda, Ohad;
- Sadia, Yatir;
- Dashevsky, Zinovy;
- Dariel, Moshe P.
- Article
32
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2059, doi. 10.1007/s11664-009-1009-7
- Kinemuchi, Yoshiaki;
- Mikami, Masashi;
- Kobayashi, Keizo;
- Watari, Koji;
- Hotta, Yuji
- Article
33
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2043, doi. 10.1007/s11664-009-1001-2
- Frantz, C.;
- Stein, N.;
- Gravier, L.;
- Granville, S.;
- Boulanger, C.
- Article
34
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2053, doi. 10.1007/s11664-009-1008-8
- Wojciechowski, K.;
- Schmidt, M.;
- Tobola, J.;
- Koza, M.;
- Olech, A.;
- Zybała, R.
- Article
35
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2064, doi. 10.1007/s11664-009-1000-3
- Tobola, Janusz;
- Kaprzyk, Stanislaw;
- Scherrer, Hubert
- Article
36
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2070, doi. 10.1007/s11664-009-1007-9
- Lukyanova, L. N.;
- Kutasov, V. A.;
- Konstantinov, P. P.;
- Popov, V. V.
- Article
37
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2029, doi. 10.1007/s11664-009-1020-z
- Zhong-wei Ruan;
- Li-sheng Liu;
- Peng-cheng Zhai;
- Peng-fei Wen;
- Qing-jie Zhang
- Article
38
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2017, doi. 10.1007/s11664-009-1019-5
- Suzuki, Ryosuke O.;
- Kozasa, Hirotake
- Article
39
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2013, doi. 10.1007/s11664-009-1015-9
- Stranz, A.;
- Sökmen, Ü.;
- Wehmann, H.-H.;
- Waag, A.;
- Peiner, E.
- Article
40
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2023, doi. 10.1007/s11664-009-1013-y
- Article
41
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2008, doi. 10.1007/s11664-009-1032-8
- Cui Yu;
- Tie-Jun Zhu;
- Kai Xiao;
- Jun-Jie Shen;
- Sheng-Hui Yang;
- Xin-Bing Zhao
- Article
42
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 2002, doi. 10.1007/s11664-009-1034-6
- Zhou, A. J.;
- Zhu, T. J.;
- Zhao, X. B.;
- Yang, S. H.;
- Dasgupta, T.;
- Stiewe, C.;
- Hassdorf, R.;
- Mueller, E.
- Article
43
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1981, doi. 10.1007/s11664-009-1038-2
- Taylor, Andrew;
- Mortensen, Clay;
- Rostek, Raimar;
- Nguyen, Ngoc;
- Johnson, David C.
- Article
44
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1975, doi. 10.1007/s11664-009-1044-4
- Stiewe, C.;
- Dasgupta, T.;
- Böttcher, L.;
- Pedersen, B.;
- Müller, E.;
- Iversen, B.
- Article
45
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1971, doi. 10.1007/s11664-009-1052-4
- Chuang, L.;
- Savvides, N.;
- Tan, T. T.;
- Li, S.
- Article
46
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1960, doi. 10.1007/s11664-009-1045-3
- Nakamura, Daiki;
- Murata, Masayuki;
- Hasegawa, Yasuhiro;
- Komine, Takashi;
- Uematsu, Daisuke;
- Nakamura, Shinichiro;
- Taguchi, Takashi
- Article
47
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1966, doi. 10.1007/s11664-009-1043-5
- Alleno, E.;
- Chen, L.;
- Chubilleau, C.;
- Lenoir, B.;
- Rouleau, O.;
- Trichet, M.;
- Villeroy, B.
- Article
48
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1987, doi. 10.1007/s11664-009-1036-4
- Article
49
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1990, doi. 10.1007/s11664-009-1037-3
- Tie-Jun Zhu;
- Yi-Qi Cao;
- Qian Zhang;
- Xin-Bing Zhao
- Article
50
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1996, doi. 10.1007/s11664-009-1033-7
- Article