Works matching IS 03615235 AND DT 2010 AND VI 39 AND IP 5
1
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 466, doi. 10.1007/s11664-010-1098-3
- Kim, Hee Jin;
- Choi, Suk;
- Yoo, Dongwon;
- Ryou, Jae-Hyun;
- Hawkridge, Michael E.;
- Liliental-Weber, Zuzanna;
- Dupuis, Russell D.
- Article
2
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 478, doi. 10.1007/s11664-010-1111-x
- Anderson, T.J.;
- Tadjer, M.J.;
- Mastro, M.A.;
- Hite, J.K.;
- Hobart, K.D.;
- Eddy, C.R.;
- Kub, F.J.
- Article
3
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 530, doi. 10.1007/s11664-009-1028-4
- Hao, Jianmin;
- Wang, Lijie;
- Feng, Bin;
- Wang, Xiangquan;
- Hong, Ying;
- Wu, Hua;
- Meng, Dalei;
- Guo, Junmin;
- Yan, Ruyue
- Article
4
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 595, doi. 10.1007/s11664-009-1017-7
- Lajn, A.;
- Wenckstern, H.;
- Benndorf, G.;
- Dietrich, C.P.;
- Brandt, M.;
- Biehne, G.;
- Hochmuth, H.;
- Lorenz, M.;
- Grundmann, M.
- Article
5
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 554, doi. 10.1007/s11664-009-0995-9
- Zhao, Dalong;
- Mourey, Devin;
- Jackson, Thomas
- Article
6
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 584, doi. 10.1007/s11664-009-0967-0
- Wenckstern, H.;
- Brachwitz, K.;
- Schmidt, M.;
- Dietrich, C.;
- Ellguth, M.;
- Stölzel, M.;
- Lorenz, M.;
- Grundmann, M.
- Article
7
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 612, doi. 10.1007/s11664-010-1130-7
- Shen, Jung-Hsiung;
- Yeh, Sung-Wei;
- Huang, Hsing-Lu;
- Gan, Dershin;
- Ho, New-Jin
- Article
8
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 559, doi. 10.1007/s11664-009-0974-1
- Wenckstern, H.;
- Müller, S.;
- Biehne, G.;
- Hochmuth, H.;
- Lorenz, M.;
- Grundmann, M.
- Article
9
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 563, doi. 10.1007/s11664-009-0984-z
- Kim, Dong-Joo;
- Hyung, Jung-Hwan;
- Seo, Deok-Won;
- Suh, Duk-Il;
- Lee, Sang-Kwon
- Article
10
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 601, doi. 10.1007/s11664-009-0973-2
- Polyakov, A.;
- Smirnov, N.;
- Govorkov, A.;
- Kozhukhova, E.;
- Belogorokhov, A.;
- Norton, D.;
- Kim, H.;
- Pearton, S.
- Article
11
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 568, doi. 10.1007/s11664-009-0999-5
- Yen, Tingfang;
- Haungs, Alan;
- Kim, Sung;
- Cartwright, Alexander;
- Anderson, Wayne
- Article
12
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 608, doi. 10.1007/s11664-009-1022-x
- Ben-Yaacov, Tammy;
- Ive, Tommy;
- Walle, Chris;
- Mishra, Umesh;
- Speck, James;
- Denbaars, Steven
- Article
13
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 545, doi. 10.1007/s11664-009-1023-9
- Los, Andrei;
- Los, Victor;
- Timoshevskii, Andrei
- Article
14
- Journal of Electronic Materials, 2010, v. 39, n. 5, p. 577, doi. 10.1007/s11664-009-1025-7
- Chai, J.;
- Mendelsberg, R.;
- Reeves, R.;
- Kennedy, J.;
- Wenckstern, H.;
- Schmidt, M.;
- Grundmann, M.;
- Doyle, K.;
- Myers, T.;
- Durbin, S.
- Article
