Works matching IS 03615235 AND DT 2010 AND VI 39 AND IP 4
1
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 376, doi. 10.1007/s11664-009-1002-1
- Maehashi, Kenzo;
- Iwasaki, Shin;
- Ohno, Yasuhide;
- Kishimoto, Takaomi;
- Inoue, Koichi;
- Matsumoto, Kazuhiko
- Article
2
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 371, doi. 10.1007/s11664-010-1094-7
- Vollebregt, S.;
- Derakhshandeh, J.;
- Ishihara, R.;
- Wu, M. Y.;
- Beenakker, C. I. M.
- Article
3
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 410, doi. 10.1007/s11664-009-1063-1
- Chang-Kyu Chung;
- Kyung-Wook Paik
- Article
4
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 355, doi. 10.1007/s11664-010-1140-5
- Burke, Robert A.;
- Xiaojun Weng;
- Meng-Wei Kuo;
- Young-Wook Song;
- Itsuno, Anne M.;
- Mayer, Theresa S.;
- Durbin, Steven M.;
- Reeves, Roger J.;
- Redwing, Joan M.
- Article
5
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 447, doi. 10.1007/s11664-010-1118-3
- Slankamenac, M.;
- Ivetić, T.;
- Nikolić, M. V.;
- Ivetić, N.;
- Živanov, M.;
- Pavlović, V. B.
- Article
6
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 433, doi. 10.1007/s11664-010-1104-9
- Article
7
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 365, doi. 10.1007/s11664-009-1071-1
- Katsman, A.;
- Yaish, Y.;
- Rabkin, E.;
- Beregovsky, M.
- Article
8
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 419, doi. 10.1007/s11664-010-1078-7
- Seung-Hyun Chae;
- Jie-Hua Zhao;
- Edwards, Darvin R.;
- Ho, Paul S.
- Article
9
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 400, doi. 10.1007/s11664-010-1082-y
- Escobedo, A.;
- Quinones, S.;
- Adame, M.;
- McClure, J.;
- Zubia, D.;
- Brill, G.
- Article
10
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 456, doi. 10.1007/s11664-010-1097-4
- Pons, Frédéric;
- Cherkaoui, Mohammed;
- Ilali, Idriss;
- Dominiak, Serge
- Article
11
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 391, doi. 10.1007/s11664-010-1101-z
- Ocampo, J. F.;
- Bertoli, B.;
- Rago, P. B.;
- Suarez, E. N.;
- Shah, D.;
- Jain, F. C.;
- Ayers, J. E.
- Article
12
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 426, doi. 10.1007/s11664-010-1093-8
- Feng Gao;
- Jianmin Qu;
- Takemoto, Tadashi
- Article
13
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 441, doi. 10.1007/s11664-010-1119-2
- Donglei Wei;
- Yanlin Huang;
- Jin soo Kim;
- Liang Shi;
- Hyo Jin Seo
- Article
14
- Journal of Electronic Materials, 2010, v. 39, n. 4, p. 381, doi. 10.1007/s11664-009-1029-3
- Wei Hu;
- Xiaofeng Xu;
- Yiqun Shen;
- Jushui Lai;
- Xiaoliu Fu;
- Jiada Wu;
- Zhifeng Ying;
- Ning Xu
- Article