Works matching IS 03615235 AND DT 2010 AND VI 39 AND IP 3
1
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 295, doi. 10.1007/s11664-009-1016-8
- Article
2
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 283, doi. 10.1007/s11664-009-1014-x
- Yung-Chi Lin;
- Kai-Jheng Wang;
- Jenq-Gong Duh
- Article
3
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 312, doi. 10.1007/s11664-009-1070-2
- Sopoušek, Jiří;
- Palcut, Marián;
- Hodúlová, Erika;
- Janovec, Jozef
- Article
4
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 333, doi. 10.1007/s11664-009-1026-6
- Zhang, X. F.;
- Guo, J. D.;
- Shang, J. K.
- Article
5
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 347, doi. 10.1007/s11664-009-1030-x
- Hao, J. G.;
- Xu, Z. J.;
- Chu, R. Q.;
- Zhang, Y. J.;
- Chen, Q.;
- Li, W.;
- Fu, P.;
- Zang, G. Z.;
- Li, G. R.;
- Yin, Q. R.
- Article
6
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 268, doi. 10.1007/s11664-009-1062-2
- Wei Lin;
- Rongwei Zhang;
- Wong, C. P.
- Article
7
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 338, doi. 10.1007/s11664-009-1064-0
- Ji Chul Yang;
- Dong Won Oh;
- Ho Joong Kim;
- Taesung Kim
- Article
8
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 263, doi. 10.1007/s11664-009-1068-9
- Voss, L. F.;
- Reinhardt, C. E.;
- Graff, R. T.;
- Conway, A. M.;
- Nikolić, R. J.;
- Deo, N.;
- Cheung, C. L.
- Article
9
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 303, doi. 10.1007/s11664-009-1061-3
- Kaya, H.;
- Böyük, U.;
- Engİn, S.;
- Çadirli, E.;
- Maraşli, N.
- Article
10
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 273, doi. 10.1007/s11664-010-1080-0
- Elmer, John W.;
- Specht, Eliot D.;
- Kumar, Mukul
- Article
11
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 318, doi. 10.1007/s11664-010-1081-z
- Onishi, Takashi;
- Mizuno, Masao;
- Yoshikawa, Tetsuya;
- Munemasa, Jun;
- Inoue, Takao;
- Miyagaki, Aki;
- Nakamoto, Hisashi;
- Onoda, Takayuki
- Article
12
- Journal of Electronic Materials, 2010, v. 39, n. 3, p. 326, doi. 10.1007/s11664-010-1072-0
- Article