Works matching IS 03615235 AND DT 2010 AND VI 39 AND IP 12
1
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2553, doi. 10.1007/s11664-010-1373-3
- Harcuba, Petr;
- Janeček, Miloš
- Article
2
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2696, doi. 10.1007/s11664-010-1375-1
- Bolen, M.;
- Shen, T.;
- Gu, J.;
- Colby, R.;
- Stach, E.;
- Ye, P.;
- Capano, M.
- Article
3
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2558, doi. 10.1007/s11664-010-1370-6
- Wang, Kai-Jheng;
- Duh, Jenq-Gong;
- Sykes, Bob;
- Schade, Dirk
- Article
4
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2636, doi. 10.1007/s11664-010-1317-y
- Wang, Y.;
- Chang, C.;
- Chen, W.;
- Kao, C.
- Article
5
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2627, doi. 10.1007/s11664-010-1349-3
- Yu, Chi-Yang;
- Duh, Jenq-Gong
- Article
6
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2618, doi. 10.1007/s11664-010-1354-6
- Chen, Chia-Ju;
- Chen, Chih-Ming;
- Horng, Ray-Hua;
- Wuu, Dong-Sing;
- Hong, Jhih-Sin
- Article
7
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2611, doi. 10.1007/s11664-010-1355-5
- Article
8
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2605, doi. 10.1007/s11664-010-1341-y
- Chen, K.;
- Zhu, Y.;
- Wu, W.;
- Reif, R.
- Article
9
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2598, doi. 10.1007/s11664-010-1344-8
- Sakurai, Hitoshi;
- Baated, Alongheng;
- Lee, Kiju;
- Kim, Seongjun;
- Kim, Keun-Soo;
- Kukimoto, Youichi;
- Kumamoto, Seishi;
- Suganuma, Katsuaki
- Article
10
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2583, doi. 10.1007/s11664-010-1350-x
- Zhou, Peng;
- Johnson, William
- Article
11
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2588, doi. 10.1007/s11664-010-1348-4
- Lee, Tae-Kyu;
- Zhou, Bite;
- Blair, Lauren;
- Liu, Kuo-Chuan;
- Bieler, Thomas
- Article
12
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2574, doi. 10.1007/s11664-010-1353-7
- Article
13
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2564, doi. 10.1007/s11664-010-1352-8
- Lee, Tae-Kyu;
- Ma, Hongtao;
- Liu, Kuo-Chuan;
- Xue, Jie
- Article
14
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2687, doi. 10.1007/s11664-010-1368-0
- Article
15
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2544, doi. 10.1007/s11664-010-1372-4
- Yu, Chi-Yang;
- Lee, Tae-Kyu;
- Tsai, Michael;
- Liu, Kuo-Chuan;
- Duh, Jenq-Gong
- Article
16
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2702, doi. 10.1007/s11664-010-1366-2
- Liu, Jianguo;
- Huang, Baling;
- Li, Xiangyou;
- Li, Ping;
- Zeng, Xiaoyan
- Article
17
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2536, doi. 10.1007/s11664-010-1369-z
- Zhang, Ning;
- Shi, Yaowu;
- Guo, Fu;
- Yang, Fuqian
- Article
18
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2681, doi. 10.1007/s11664-010-1367-1
- Arslan, Engin;
- Bütün, Serkan;
- Şafak, Yasemin;
- Ozbay, Ekmel
- Article
19
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2528, doi. 10.1007/s11664-010-1376-0
- Tsai, M.;
- Lin, Y.;
- Ke, J.;
- Kao, C.
- Article
20
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2522, doi. 10.1007/s11664-010-1371-5
- Tseng, Chien-Fu;
- Wang, Kai-Jheng;
- Duh, Jenq-Gong
- Article
21
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2504, doi. 10.1007/s11664-010-1379-x
- Kim, Young;
- Roh, Hee-Ra;
- Kim, Sungtae;
- Kim, Young-Ho
- Article
22
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2513, doi. 10.1007/s11664-010-1377-z
- Zhang, Ruihong;
- Xu, Guangchen;
- Wang, Xitao;
- Guo, Fu;
- Lee, Andre;
- Subramanian, K.
- Article
23
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2503, doi. 10.1007/s11664-010-1389-8
- Article
24
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2669, doi. 10.1007/s11664-010-1380-4
- Zhou, Bite;
- Bieler, Thomas;
- Lee, Tae-kyu;
- Liu, Kuo-Chuan
- Article
25
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2711, doi. 10.1007/s11664-010-1381-3
- Manjunatha, M.;
- Adhikari, A.;
- Hegde, P.;
- Suchand Sandeep, C.;
- Philip, Reji
- Article
26
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2720, doi. 10.1007/s11664-010-1382-2
- Kotadia, H.;
- Mokhtari, O.;
- Bottrill, M.;
- Clode, M.;
- Green, M.;
- Mannan, S.
- Article
27
- 2010
- Dalili, Neda;
- He, Anqiang;
- Liu, Qi;
- Ivey, Douglas
- Correction Notice
28
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2653, doi. 10.1007/s11664-010-1299-9
- Wu, W.;
- Chung, H.;
- Chen, B.;
- Ho, C.
- Article
29
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2662, doi. 10.1007/s11664-010-1272-7
- Chang, C.C.;
- Chung, H.Y.;
- Lai, Y.S.;
- Kao, C.R.
- Article
30
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2643, doi. 10.1007/s11664-010-1313-2
- Chang, Jaewon;
- Seo, Sun-Kyoung;
- Lee, Hyuck
- Article