Works matching IS 03615235 AND DT 2009 AND VI 38 AND IP 5
1
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 635, doi. 10.1007/s11664-009-0731-5
- Dylewicz, R.;
- Patela, S.;
- Hogg, R.;
- Fry, P.;
- Parbrook, P.;
- Airey, R.;
- Tahraoui, A.
- Article
2
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 647, doi. 10.1007/s11664-009-0732-4
- Lum, I.;
- Hang, C. J.;
- Mayer, M.;
- Zhou, Y.
- Article
3
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 706, doi. 10.1007/s11664-009-0729-z
- Y. Yuan;
- S. R. Zhang;
- X. H. Zhou;
- B. Tang;
- B. Li
- Article
4
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 670, doi. 10.1007/s11664-009-0689-3
- Hidaka, N.;
- Watanabe, H.;
- Yoshiba, M.
- Article
5
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 640, doi. 10.1007/s11664-009-0678-6
- Pyshkin, Sergei;
- Ballato, John;
- Bass, Michael;
- Turri, Giorgio
- Article
6
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 691, doi. 10.1007/s11664-008-0636-8
- Ja-Young Jung;
- Shin-Bok Lee;
- Ho-Young Lee;
- Young-Chang Joo;
- Young-Bae Park
- Article
7
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 700, doi. 10.1007/s11664-008-0632-z
- Article
8
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 685, doi. 10.1007/s11664-008-0646-6
- Y. K. Jee;
- J. Yu;
- K. W. Park;
- T. S. Oh
- Article
9
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 711, doi. 10.1007/s11664-009-0721-7
- Huanfu Zhou;
- Hong Wang;
- Kecheng Li;
- Haibo Yang;
- Minghui Zhang;
- Xi Yao
- Article
10
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 655, doi. 10.1007/s11664-009-0720-8
- Chao-hong Wang;
- Sinn-wen Chen
- Article
11
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 623, doi. 10.1007/s11664-009-0658-x
- Dogra, Rakesh;
- Byrne, A. P.;
- Ridgway, M. C.
- Article
12
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 678, doi. 10.1007/s11664-009-0685-7
- J. S. Zhang;
- H. J. Xi;
- Y. P. Wu;
- F. S. Wu
- Article
13
- Journal of Electronic Materials, 2009, v. 38, n. 5, p. 663, doi. 10.1007/s11664-009-0722-6
- Hongbo Xu;
- Mingyuo Li;
- Hongtao Chen;
- Yonggao Fu;
- Ling Wang
- Article
