Works matching IS 03615235 AND DT 2009 AND VI 38 AND IP 10
1
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2023, doi. 10.1007/s11664-009-0887-z
- Rathi, M. K.;
- Tsvid, G.;
- Khandekar, A. A.;
- Shin, J. C.;
- Botez, D.;
- Kuech, T. F.
- Article
2
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2132, doi. 10.1007/s11664-009-0872-6
- Ning Zhang;
- Yaowu Shi;
- Yongping Lei;
- Zhidong Xia;
- Fu Guo;
- Xiaoyan Li
- Article
3
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2052, doi. 10.1007/s11664-009-0877-1
- Civale, Yann;
- Vastola, Guglielmo;
- Nanver, Lis;
- Mary-Joy, Rani;
- Jae-Ryoung Kim
- Article
4
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2194, doi. 10.1007/s11664-009-0855-7
- Jang-Hee Lee;
- Young-Bae Park
- Article
5
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2184, doi. 10.1007/s11664-009-0852-x
- Wu, W. H.;
- Peng, S. P.;
- Lin, C. S.;
- Ho, C. E.
- Article
6
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2063, doi. 10.1007/s11664-009-0856-6
- Venugopal, Vijayaharan A.;
- Ottaviani, Giampiero;
- Bresolin, Camillo;
- Erbetta, Davide;
- Modelli, Alberto;
- Varesi, Enrico
- Article
7
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2106, doi. 10.1007/s11664-009-0861-9
- Wang, Pin J.;
- Kim, Jong S.;
- Lee, Chin C.
- Article
8
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2148, doi. 10.1007/s11664-009-0863-7
- Article
9
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2170, doi. 10.1007/s11664-009-0868-2
- Hong Chang;
- Hongtao Chen;
- Mingyu Li;
- Ling Wang;
- Yonggao Fu
- Article
10
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2158, doi. 10.1007/s11664-009-0874-4
- Dong, H. Q.;
- Jin, S.;
- Zhang, L. G.;
- Wang, J. S.;
- Tao, X. M.;
- Liu, H. S.;
- Jin, Z. P.
- Article
11
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2122, doi. 10.1007/s11664-009-0878-0
- Sivasubramaniam, V.;
- Galli, M.;
- Cugnoni, J.;
- Janczak-Rusch, J.;
- Botsis, J.
- Article
12
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2179, doi. 10.1007/s11664-009-0858-4
- Yin, L. M.;
- Zhang, X. P.;
- Chunsheng Lu
- Article
13
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2085, doi. 10.1007/s11664-009-0885-1
- Herkommer, Dominik;
- Reid, Michael;
- Punch, Jeff
- Article
14
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2046, doi. 10.1007/s11664-009-0865-5
- Raman, R.;
- Kapoor, Ashok;
- Kumar, Shiv;
- Pandey, Akhilesh
- Article
15
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2096, doi. 10.1007/s11664-009-0859-3
- Gao, F.;
- Wang, C. P.;
- Li, Y. Y.;
- Liu, X. J.;
- Takaku, Y.;
- Ohnuma, I.;
- Ishida, K.
- Article
16
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2112, doi. 10.1007/s11664-009-0884-2
- Hwa-Teng Lee;
- Choo-Yeow Lee;
- Fok-Foo Lee;
- Yin-Fa Chen;
- Yang-Hsien Lee
- Article
17
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2069, doi. 10.1007/s11664-009-0883-3
- Chuangang Lin;
- Chung, D. D. L.
- Article
18
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2033, doi. 10.1007/s11664-009-0875-3
- Yajun Liu;
- Lijun Zhang;
- Di Yu
- Article
19
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2207, doi. 10.1007/s11664-009-0892-2
- Gu, Y. H.;
- Chen, W. P.;
- Qi, J. Q,;
- Tian, H. Y.;
- Wang, Y.;
- Chan, H. L. W.
- Article
20
- Journal of Electronic Materials, 2009, v. 38, n. 10, p. 2201, doi. 10.1007/s11664-009-0853-9
- Sasagawa, Kazuhiko;
- Fukushi, Shota;
- Yuxin Sun;
- Saka, Masumi
- Article