Works matching IS 03615235 AND DT 2008 AND VI 37 AND IP 9


Results: 52
    1

    Erratum.

    Published in:
    2008
    Publication type:
    Correction Notice
    2
    3
    4

    Foreword.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1165, doi. 10.1007/s11664-008-0505-5
    By:
    • Sivananthan, S.;
    • Anter, Y.;
    • Dhar, N. K.
    Publication type:
    Article
    5
    6

    Structural Analysis of CdTe Hetero-epitaxy on (211) Si.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1231, doi. 10.1007/s11664-008-0469-5
    By:
    • BENSON, J. D.;
    • JACOBS, R. N.;
    • MARKUNAS, J. K.;
    • JAIME-VASQUEZ, M.;
    • SMITH, P. J.;
    • ALMEIDA, L. A.;
    • MARTINKA, M.;
    • VILELA, M. F.;
    • LEE, U.
    Publication type:
    Article
    7
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    9
    10
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    14
    15
    16
    17

    ZnO TFT Devices Built on Glass Substrates.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1237, doi. 10.1007/s11664-008-0457-9
    By:
    • ZHU, J.;
    • CHEN, H.;
    • SARAF, G.;
    • DUAN, Z.;
    • LU, Y.;
    • HSU, S. T.
    Publication type:
    Article
    18
    19
    20

    As Doping in (Hg,Cd)Te: An Alternative Point of View.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1291, doi. 10.1007/s11664-008-0452-1
    By:
    • HAILS, JANET E.;
    • IRVINE, STUART J. C.;
    • COLE-HAMILTON, DAVID J.;
    • GIESS, JEAN;
    • HOULTON, MICHAEL R.;
    • GRAHAM, ANDREW
    Publication type:
    Article
    21
    22
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    24

    LWIR HgCdTe Detectors Grown on Ge Substrates.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1465, doi. 10.1007/s11664-008-0443-2
    By:
    • VILELA, M. F.;
    • LOFGREEN, D. D.;
    • SMITH, E. P. G.;
    • NEWTON, M. D.;
    • VENZOR, G. M.;
    • PETERSON, J. M.;
    • FRANKLIN, J. J.;
    • REDDY, M.;
    • THAI, Y.;
    • PATTEN, E. A.;
    • JOHNSON, S. M.;
    • TIDROW, M. Z.
    Publication type:
    Article
    25
    26

    MBE HgCdTe on Alternative Substrates for FPA Applications.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1189, doi. 10.1007/s11664-008-0441-4
    By:
    • LI HE;
    • XIANGLIANG FU;
    • QINGZHU WEI;
    • WEIQIANG WANG;
    • LU CHEN;
    • YAN WU;
    • XIAONING HU;
    • JIANRONG YANG;
    • QINYAO ZHANG;
    • RUIJUN DING;
    • XIAOSHUANG CHEN;
    • WEI LU
    Publication type:
    Article
    27
    28
    29
    30
    31
    32

    Status of LWIR HgCdTe-on-Silicon FPA Technology.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1184, doi. 10.1007/s11664-008-0434-3
    By:
    • CARMODY, M.;
    • PASKO, J. G.;
    • EDWALL, D.;
    • PIQUETTE, E.;
    • KANGAS, M.;
    • FREEMAN, S.;
    • ARIAS, J.;
    • JACOBS, R.;
    • MASON, W.;
    • STOLTZ, A.;
    • CHEN, Y.;
    • DHAR, N. K.
    Publication type:
    Article
    33
    34

    Noise Attributes of LWIR HDVIP HgCdTe Detectors.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1318, doi. 10.1007/s11664-008-0432-5
    By:
    • D'SOUZA, A. I.;
    • STAPELBROEK, M. G.;
    • ROBINSON, E. W.;
    • YONEYAMA, C.;
    • MILLS, H. A.;
    • KINCH, M. A.;
    • SKOKAN, M. R.;
    • SHIH, H. D.
    Publication type:
    Article
    35
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    42

    Anisotropic Surface Roughness in Molecular-Beam Epitaxy CdTe (211)B/Ge(211).

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1369, doi. 10.1007/s11664-008-0424-5
    By:
    • BADANO, GIACOMO;
    • BAUDRY, XAVIER;
    • BALLET, PHILIPPE;
    • DUVAUT, PHILIPPE;
    • MILLION, ALAIN;
    • MICOUD, ERIC;
    • KAISMOUNE, SABEUR;
    • FOUGÈRES, PAUL;
    • MIBORD, SOPHIE;
    • TRAN-VAN, PIERRE;
    • ETCHEBERRY, ARNAUD
    Publication type:
    Article
    43

    High-Operating-Temperature MWIR Detector Diodes.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1401, doi. 10.1007/s11664-008-0423-6
    By:
    • SCHAAKE, H. F.;
    • KINCH, M. A.;
    • CHANDRA, D.;
    • AQARIDEN, F.;
    • LIAO, P. K.;
    • WEIRAUCH, D. F.;
    • WAN, C.-F.;
    • SCRITCHFIELD, R. E.;
    • SULLIVAN, W. W.;
    • TEHERANI, J. T.;
    • SHIH, H. D.
    Publication type:
    Article
    44
    45
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    48

    Modeling of Recombination in HgCdTe.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1415, doi. 10.1007/s11664-008-0417-4
    By:
    • GREIN, C. H.;
    • FLATTÉ, M. E.;
    • YONG CHANG
    Publication type:
    Article
    49

    ZnO and Related Materials for Sensors and Light-Emitting Diodes.

    Published in:
    Journal of Electronic Materials, 2008, v. 37, n. 9, p. 1426, doi. 10.1007/s11664-008-0416-5
    By:
    • PEARTON, S. J.;
    • LIM, W. T.;
    • WRIGHT, J. S.;
    • TIEN, L. C.;
    • KIM, H. S.;
    • NORTON, D. P.;
    • WANG, H. T.;
    • KANG, B. S.;
    • REN, F.;
    • JUN, J.;
    • LIN, J.;
    • OSINSKY, A.
    Publication type:
    Article
    50