Simultaneous Formation of Ni/Al Ohmic Contacts to Both n- and p-Type 4H-SiC.Published in:Journal of Electronic Materials, 2008, v. 37, n. 11, p. 1674, doi. 10.1007/s11664-008-0525-1By:Ito, Kazuhiro;Onishi, Toshitake;Takeda, Hidehisa;Kohama, Kazuyuki;Tsukimoto, Susumu;Konno, Mitsuru;Suzuki, Yuya;Murakami, MasanoriPublication type:Article