Works matching IS 03615235 AND DT 2007 AND VI 36 AND IP 8
Results: 45
Diffusion of Selenium in Liquid-Phase Epitaxy--Grown Hg<sub>0.78</sub>Cd<sub>0.22</sub>Te.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 822, doi. 10.1007/s11664-007-0096-6
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Secondary Ion Mass Spectrometry and Time-of-Flight Secondary Ion Mass Spectrometry Study of Impurity Measurements in HgCdTe.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1106, doi. 10.1007/s11664-007-0183-8
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Role of Dislocation Scattering on the Electron Mobility of n-Type Long Wave Length Infrared HgCdTe on Silicon.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1098, doi. 10.1007/s11664-007-0182-9
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Synchrotron X-ray Based Characterization of CdZnTe Crystals.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1092, doi. 10.1007/s11664-007-0181-x
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Foreword.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 821, doi. 10.1007/s11664-007-0180-y
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High-Performance LWIR MBE-Grown HgCdTe/Si Focal Plane Arrays.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1085, doi. 10.1007/s11664-007-0177-6
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Fast Detection of Precipitates and Oxides on CdZnTe Surfaces by Spectroscopic Ellipsometry.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1077, doi. 10.1007/s11664-007-0176-7
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Effect of Dislocations on VLWIR HgCdTe Photodiodes.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1068, doi. 10.1007/s11664-007-0173-x
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HgCdTe MWIR Back-Illuminated Electron-Initiated Avalanche Photodiode Arrays.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1059, doi. 10.1007/s11664-007-0172-y
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Metal-Organic Chemical Vapor Deposition of Hg<sub>1-x</sub>Cd<sub>x</sub>Te Fully Doped Heterostructures Without Postgrowth Anneal for Uncooled MWIR and LWIR Detectors.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1052, doi. 10.1007/s11664-007-0171-z
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Fabrication and Characterization of Small Unit-Cell Molecular Beam Epitaxy Grown HgCdTe-on-Si Mid-Wavelength Infrared Detectors.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1045, doi. 10.1007/s11664-007-0169-6
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- Article
Status of HgCdTe Bicolor and Dual-Band Infrared Focal Arrays at LETI.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1031, doi. 10.1007/s11664-007-0168-7
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- Article
Elimination of Inclusions in (CdZn)Te Substrates by Post-grown Annealing.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1025, doi. 10.1007/s11664-007-0167-8
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Chemical Etching of CdTe in Aqueous Solutions of H<sub>2</sub>O<sub>2</sub>-HI-Citric Acid.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1021, doi. 10.1007/s11664-007-0166-9
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Component Overpressure Growth and Characterization of High-Resistivity CdTe Crystals for Radiation Detectors.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1013, doi. 10.1007/s11664-007-0164-y
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From Long Infrared to Very Long Infrared Wavelength Focal Plane Arrays Made with HgCdTe n<sup>+</sup>n<sup>-</sup>/p Ion Implantation Technology.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 981, doi. 10.1007/s11664-007-0151-3
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Absorption of Narrow-Gap HgCdTe Near the Band Edge Including Nonparabolicity and the Urbach Tail.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1000, doi. 10.1007/s11664-007-0162-0
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Comparative Study of HgCdTe Etchants: An Electrical Characterization.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 993, doi. 10.1007/s11664-007-0159-8
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MCT-on-Silicon Negative Luminescence Devices with High Efficiency.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 988, doi. 10.1007/s11664-007-0152-2
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Accurate Determination of the Matrix Composition Profile of Hg<sub>1-x</sub>Cd<sub>x</sub>Te by Secondary Ion Mass Spectrometry.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 910, doi. 10.1007/s11664-007-0131-7
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Comparing ICP and ECR Etching of HgCdTe, CdZnTe, and CdTe.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 1007, doi. 10.1007/s11664-007-0163-z
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Gain and Dark Current Characteristics of Planar HgCdTe Avalanche Photo Diodes.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 963, doi. 10.1007/s11664-007-0147-z
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Improved Defect and Fourier Transform Infrared Spectroscopy Analysis for Prediction of Yield for HgCdTe Multilayer Heterostructures.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 958, doi. 10.1007/s11664-007-0146-0
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Surface Structure of Molecular Beam Epitaxy (211)B HgCdTe.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 949, doi. 10.1007/s11664-007-0143-3
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Investigation of Artificial Forced Cooling in the Bridgman Crystal Growth of Cadmium Zinc Telluride.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 971, doi. 10.1007/s11664-007-0149-x
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Assessment of Tight Pixel Geometry Influence on Surface Chemistry of Hg<sub>1-X</sub>Cd<sub>X</sub>Te Focal Plane Array by Time of Flight--Secondary Ion Mass Spectroscopy: Novel Analytical Methods.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 937, doi. 10.1007/s11664-007-0141-5
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Selective Growth of CdTe on Si(211): First-Principle Calculations.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 925, doi. 10.1007/s11664-007-0134-4
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Extended X-Ray Absorption Fine Structure Study of Arsenic in HgCdTe.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 919, doi. 10.1007/s11664-007-0133-5
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Effect of High-Density Plasma Process Parameters on Carrier Transport Properties in p-to-n Type Converted Hg<sub>0.7</sub>Cd<sub>0.3</sub>Te Layer.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 913, doi. 10.1007/s11664-007-0132-6
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Design and Assessment of Metal-Organic Vapor Phase Epitaxy--Grown Dual Waveband Infrared Detectors.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 931, doi. 10.1007/s11664-007-0135-3
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Nucleation of ZnTe on the As-Terminated Si(112) Surface.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 905, doi. 10.1007/s11664-007-0128-2
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Development of Molecular Beam Epitaxially Grown Hg<sub>1-x</sub>Cd<sub>x</sub>Te for High-Density Vertically-Integrated Photodiode-Based Focal Plane Arrays.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 900, doi. 10.1007/s11664-007-0127-3
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Fast and Reversible Wettability Transitions on ZnO Nanostructures.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 895, doi. 10.1007/s11664-007-0126-4
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Microscopic Origin of Electrical Compensation in Arsenic-Doped HgCdTe by Molecular Beam Epitaxy: Density Functional Study.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 890, doi. 10.1007/s11664-007-0123-7
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Investigation of 1/f Noise Mechanisms in Midwave Infrared HgCdTe Gated Photodiodes.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 884, doi. 10.1007/s11664-007-0120-x
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Optical and Structural Properties of CdTe Grown by Molecular Beam Epitaxy at Low Temperature for Resonant-Cavity-Enhanced HgCdTe Detectors.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 877, doi. 10.1007/s11664-007-0115-7
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Screening Effects in High Resistivity CdTe for X-ray and Gamma Ray Detectors.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 871, doi. 10.1007/s11664-007-0114-8
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Influence of the Silicon Substrate on Defect Formation in MCT Grown on II-VI Buffered Si Using a Combined Molecular Beam Epitaxy/Metal Organic Vapor Phase Epitaxy Technique.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 864, doi. 10.1007/s11664-007-0113-9
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Electron and Hole Transport in Bulk ZnO: A Full Band Monte Carlo Study.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 857, doi. 10.1007/s11664-007-0111-y
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Antimonide Type-II "W" Photodiodes with Long-Wave Infrared R<sub>0</sub>A Comparable to HgCdTe.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 852, doi. 10.1007/s11664-007-0109-5
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Magneto-Transport Characterization of p-Type HgCdTe.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 826, doi. 10.1007/s11664-007-0103-y
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Modeling and Design Considerations of HgCdTe Infrared Photodiodes under Nonequilibrium Operation.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 846, doi. 10.1007/s11664-007-0107-7
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Excimer Laser Etching Process of CdTe Crystals for Formation of Deep Vertical Trenches.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 837, doi. 10.1007/s11664-007-0105-9
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Electrical Characteristics of PEDOT:PSS Organic Contacts to HgCdTe.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 841, doi. 10.1007/s11664-007-0106-8
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Characterization of HgCdTe Diodes on Si Substrates Using Temperature-Dependent Current-Voltage Measurements and Deep Level Transient Spectroscopy.
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- Journal of Electronic Materials, 2007, v. 36, n. 8, p. 832, doi. 10.1007/s11664-007-0104-x
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