Works matching IS 03615235 AND DT 2006 AND VI 35 AND IP 7


Results: 16
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    Structural Defects in Si-Doped III-V Nitrides.

    Published in:
    Journal of Electronic Materials, 2006, v. 35, n. 7, p. 1543, doi. 10.1007/s11664-006-0146-5
    By:
    • Zakharov, Dmitri N.;
    • Liliental-Weber, Zuzanna;
    • Yan Gao;
    • Hu, Evelyn
    Publication type:
    Article
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    p-n Junctions in Silicon Nanowires.

    Published in:
    Journal of Electronic Materials, 2006, v. 35, n. 7, p. 1509, doi. 10.1007/s11664-006-0140-y
    By:
    • Goncher, G.;
    • Solanki, R.;
    • Carruthers, J. R.;
    • Conley Jr., J.;
    • Ono, Y.
    Publication type:
    Article