Works matching IS 03615235 AND DT 2006 AND VI 35 AND IP 5
1
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 993, doi. 10.1007/BF02692559
- Bet, Sachin;
- Kar, Aravinda
- Article
2
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 988, doi. 10.1007/BF02692558
- Franc, J.;
- Grill, R.;
- Kubát, J.;
- Hlídek, P.;
- Belas, E.;
- Moravec, P.;
- Höschl, P.
- Article
3
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 978, doi. 10.1007/BF02692557
- Po-Yi Yeh;
- Jenn-Ming Song;
- Kwang-Lung Lin
- Article
4
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 972, doi. 10.1007/BF02692556
- Article
5
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 966, doi. 10.1007/BF02692555
- Chih-Yao Liu;
- Moo-Chin Wang;
- Min-Hsiung Hon
- Article
6
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 958, doi. 10.1007/BF02692554
- Liu, D. S.;
- Chen, C. Y.;
- Chao, Y. C.
- Article
7
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 954, doi. 10.1007/BF02692553
- Xu, C.;
- Jia, Z.;
- Wu, D.;
- Han, Q.;
- Meek, T.
- Article
8
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 947, doi. 10.1007/BF02692552
- Hsu, C. Y.;
- Yao, D. J.;
- Liang, S. W.;
- Chih Chen;
- Yeh, Everett C. C.
- Article
9
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 941, doi. 10.1007/BF02692551
- Rao, R.;
- Chandrasekaran, H.;
- Gubbala, S.;
- Sunkara, M. K.;
- Daraio, C.;
- Jin, S.;
- Rao, A. M.
- Article
10
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 937, doi. 10.1007/BF02692550
- Yu-Long Jiang;
- Guo-Ping Ru;
- Xin-Ping Qu;
- Bing-Zong Li;
- Agarwal, Aditya;
- Poate, John;
- Hossain, Khalid;
- Holland, Wayne
- Article
11
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 929, doi. 10.1007/BF02692549
- Jenn-Ming Song;
- Truan-Sheng Lui;
- Yea-Luen Chang;
- Li-Hui Chen
- Article
12
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 922, doi. 10.1007/BF02692548
- Chih-Chi Chen;
- Sinn-Wen Chen;
- Ching-Ya Kao
- Article
13
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 912, doi. 10.1007/BF02692547
- Coughlan, F. M.;
- Lewis, H. J.
- Article
14
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 905, doi. 10.1007/BF02692546
- Gao, F.;
- Takemoto, T.;
- Nishikawa, H.;
- Komatsu, A.
- Article
15
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 897, doi. 10.1007/BF02692545
- Yanghua Xia;
- Chuanyan Lu;
- Junling Chang;
- Xiaoming Xie
- Article
16
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 892, doi. 10.1007/BF02692544
- Hongtao Guan;
- Shunhua Liu;
- Yanbo Zhao;
- Yuping Duan
- Article
17
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 877, doi. 10.1007/BF02692543
- Rabus, M.;
- Fiory, A. T.;
- Ravindra, N. M.;
- Frisella, P.;
- Agarwal, A.;
- Sorsch, T.;
- Miner, J.;
- Ferry, E.;
- Klemens, F.;
- Cirelli, R.;
- Mansfield, W.
- Article
18
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 834, doi. 10.1007/BF02692536
- Abedrabbo, S.;
- Arafah, D. E.;
- Gokce, O.;
- Wielunski, L. S.;
- Gharaibeh, M.;
- Celik, O.;
- Ravindra, N. M.
- Article
19
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 869, doi. 10.1007/BF02692542
- Chunming Jin;
- Narayan, Roger J.
- Article
20
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 857, doi. 10.1007/BF02692540
- Article
21
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 852, doi. 10.1007/BF02692539
- Prater, John T.;
- Ramachandran, Shivaraman;
- Tiwari, Ashutosh;
- Narayan, Jagdish
- Article
22
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 846, doi. 10.1007/BF02692538
- Zhao, Y.-P.;
- Li, S.-H.;
- Chaney, S. B.;
- Shanmukh, S.;
- Fan, J.-G.;
- Dluhy, R. A.;
- Kisaalita, W.
- Article
23
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 840, doi. 10.1007/BF02692537
- Chugh, Amit;
- Ramachandran, S.;
- Tiwari, A.;
- Narayan, J.
- Article
24
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 862, doi. 10.1007/BF02692541
- Pearton, S. J.;
- Norton, D. P.;
- Heo, Y. W.;
- Tien, L. C.;
- Ivill, M. P.;
- Li, Y.;
- Kang, B. S.;
- Ren, F.;
- Kelly, J.;
- Hebard, A. F.
- Article
25
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 822, doi. 10.1007/BF02692535
- Oktyabrsky, S.;
- Tokranov, V.;
- Agnello, G.;
- Van Eisden, J.;
- Yakimov, M.
- Article
26
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 814, doi. 10.1007/BF02692534
- Palaniyandi, Velmurugan;
- Shamsuzzoha, Mohammad;
- Ada, Earl T.;
- Zangari, Giovanni;
- Reddy, Ramana G.
- Article
27
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 808, doi. 10.1007/BF02692533
- Shamsuzzoha, M.;
- Ada, E. T.;
- Reddy, R. G.
- Article
28
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1133, doi. 10.1007/BF02692577
- Article
29
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1127, doi. 10.1007/BF02692576
- Nishikawa, Hiroshi;
- Jin Yu Piao;
- Takemoto, Tadashi
- Article
30
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1122, doi. 10.1007/BF02692575
- Bolotnikov, A.;
- Muzykov, P.;
- Sudarshan, T. S.
- Article
31
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1112, doi. 10.1007/BF02692574
- Seongho Park;
- Krotine, Jeff;
- Allen, Sue Ann Bidstrup;
- Kohl, Paul A.
- Article
32
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1104, doi. 10.1007/BF02692573
- Adekore, B. T.;
- Rakes, K.;
- Wang, B.;
- Callahan, M. J.;
- Pendurti, S.;
- Sitar, Z.
- Article
33
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1095, doi. 10.1007/BF02692572
- Weimin Xiao;
- Yaowu Shi;
- Yongping Lei;
- Zhidong Xia;
- Fu Guo
- Article
34
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1087, doi. 10.1007/BF02692571
- Article
35
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1082, doi. 10.1007/BF02692570
- Chen, K. N.;
- Chang, S. M.;
- Shen, L. C.;
- Reif, R.
- Article
36
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1074, doi. 10.1007/BF02692569
- Hasegawa, T.;
- Saka, M.;
- Watanabe, Y.
- Article
37
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1067, doi. 10.1007/BF02692568
- Hoe-Rok Jung;
- Hyuk-Hwan Kim;
- Won-Jong Lee
- Article
38
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1059, doi. 10.1007/BF02692567
- Iting Tsai;
- Enboa Wu;
- Yen, S. F.;
- Chuang, T. H.
- Article
39
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1050, doi. 10.1007/BF02692566
- Rist, Martin A.;
- Plumbridge, W. J.;
- Cooper, S.
- Article
40
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1041, doi. 10.1007/BF02692565
- Jenn-Ming Song;
- Hsin-Yi Chuang;
- Zong-Mou Wu
- Article
41
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1032, doi. 10.1007/BF02692564
- Huann-Wu Chiang;
- Jun-Yuan Chen;
- Ming-Chuan Chen;
- Lee, Jeffrey C. B.;
- Shiau, Gary
- Article
42
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1025, doi. 10.1007/BF02692563
- Peng Su;
- Jie-Hua Zhao;
- Pozder, Scott;
- Wontor, David
- Article
43
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1017, doi. 10.1007/BF02692562
- Ho, C. E.;
- Lin, Y. W.;
- Yang, S. C.;
- Kao, C. R.;
- Jiang, D. S.
- Article
44
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1010, doi. 10.1007/BF02692561
- Lin, Y. L.;
- Chang, C. W.;
- Tsai, C. M.;
- Lee, C. W.;
- Kao, C. R.
- Article
45
- Journal of Electronic Materials, 2006, v. 35, n. 5, p. 1005, doi. 10.1007/BF02692560
- Tsai, C. M.;
- Lin, Y. L.;
- Tsai, J. Y.;
- Yi-Shao Lai;
- Kao, C. R.
- Article