Works matching IS 03615235 AND DT 2006 AND VI 35 AND IP 4
Results: 49
Evolution of ZnO Nanostructures on Silicon Substrate by Vapor--Solid Mechanism: Structural and Optical Properties.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 758, doi. 10.1007/s11664-006-0135-8
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Optimized Doping and Contact Scheme for Low-Voltage 275-nm Deep Ultraviolet LEDs.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 750, doi. 10.1007/s11664-006-0133-x
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GaN/AlN Multiple Quantum Wells Grown on GaN-AlN Waveguide Structure by Metalorganic Vapor-Phase Epitaxy.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 744, doi. 10.1007/s11664-006-0132-y
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Metalorganic Chemical Vapor Deposition Growth and Characterization of InGaP/GaAs Superlattices.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 705, doi. 10.1007/s11664-006-0125-x
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Characterization of Ti Schottky Diodes on Epi-Regrown 4H-SiC.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 754, doi. 10.1007/s11664-006-0134-9
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Selective Growth and Directed Integration of ZnO Nanobridge Devices on Si Substrates without a Metal Catalyst Using a ZnO Seed Layer.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 795, doi. 10.1007/s11664-006-0139-4
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Advances in Pulsed-Laser-Deposited AlN Thin Films for High-Temperature Capping, Device Passivation, and Piezoelectric-Based RF MEMS/NEMS Resonator Applications.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 777, doi. 10.1007/s11664-006-0138-5
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Digital Etching of III-N Materials Using a Two-Step Ar/KOH Technique.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 771, doi. 10.1007/s11664-006-0137-6
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Metalorganic Chemical Vapor Deposition and Characterization of ZnO Materials.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 766, doi. 10.1007/s11664-006-0136-7
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Electrical Transport Properties of Single GaN and InN Nanowires.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 738, doi. 10.1007/s11664-006-0131-z
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Comparison of MOS Capacitors on n- and p-Type GaN.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 726, doi. 10.1007/s11664-006-0129-6
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High-Temperature Transport Properties of 2DEG in AlGaN/GaN Heterostructures.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 722, doi. 10.1007/s11664-006-0128-7
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- Article
Photoluminescence Properties of GaN with Dislocations Induced by Plastic Deformation.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 717, doi. 10.1007/s11664-006-0127-8
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- Article
Optoelectronic Properties of Expanding Thermal Plasma Deposited Textured Zinc Oxide: Effect of Aluminum Doping.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 711, doi. 10.1007/s11664-006-0126-9
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Band Offsets Analysis of Dilute Nitride Single Quantum Well Structures Employing Surface Photo Voltage Measurements.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 733, doi. 10.1007/s11664-006-0130-0
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Effect of Thin Strain-Compensated Al<sub>0.6</sub>Ga<sub>0.4</sub>P Layers on the Growth of Multiple-Stacked InP/In<sub>0.5</sub>Al<sub>0.3</sub>Ga<sub>0.2</sub>P Quantum Dots.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 701, doi. 10.1007/s11664-006-0124-y
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- Article
Growth of InGaN HBTs by MOCVD.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 695, doi. 10.1007/s11664-006-0123-z
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- Article
Si-Diffused GaN for Enhancement-Mode GaN MOSFET on Si Applications.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 685, doi. 10.1007/s11664-006-0121-1
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- Article
ZnO Growth on Si with Low-Temperature CdO and ZnO Buffer Layers by Molecular-Beam Epitaxy.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 691, doi. 10.1007/s11664-006-0122-0
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Selective Dry Etching of (Sc<sub>2</sub>O<sub>3</sub>)<sub>x</sub>(Ga<sub>2</sub>O<sub>3</sub>)<sub>1-x</sub> Gate Dielectrics and Surface Passivation Films on GaN.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 680, doi. 10.1007/s11664-006-0120-2
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Comparison of Laser-Wavelength Operation for Drilling of Via Holes in AlGaN/GaN HEMTs on SiC Substrates.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 675, doi. 10.1007/s11664-006-0119-8
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High-Yield GaN Nanowire Synthesis and Field-Effect Transistor Fabrication.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 670, doi. 10.1007/s11664-006-0118-9
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Electrical Properties of Undoped Bulk ZnO Substrates.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 663, doi. 10.1007/s11664-006-0117-x
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Annealing Temperature Dependence of TiB<sub>2</sub> Schottky Barrier Contacts on n-GaN.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 658, doi. 10.1007/s11664-006-0116-y
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Investigation of GaN<sub>x</sub>P<sub>1-x</sub>/GaP LED Structure Optical Properties.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 654, doi. 10.1007/s11664-006-0115-z
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Electrical and Optical Characterization Studies of Lower Dose Si-Implanted Al<sub>x</sub>Ga<sub>1-x</sub>N.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 647, doi. 10.1007/s11664-006-0114-0
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Growth of AlGaN Alloys Exhibiting Enhanced Luminescence Efficiency.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 641, doi. 10.1007/s11664-006-0113-1
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Room-Temperature Ferromagnetic Ordering in Mn-Doped ZnO Thin Films Grown by Pulsed Laser Deposition.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 635, doi. 10.1007/s11664-006-0112-2
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Relationship between Infrared Photoluminescence and Resistivity in Semi-Insulating 6H-SiC.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 630, doi. 10.1007/s11664-006-0111-3
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Extraction of SiO<sub>2</sub>/SiC Interface Trap Profile in 4H- and 6H-SiC Metal-Oxide Semiconductor Field-Effect Transistors from Subthreshold Characteristics at 25°C and 150°C.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 618, doi. 10.1007/s11664-006-0109-x
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- Article
Effect of High-Temperature Processing on the Creation of Boron-Related Deep Levels in 4H-SiC.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 625, doi. 10.1007/s11664-006-0110-4
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- Article
Giant Traps on the Surface of Hydride Vapor Phase Epitaxy--Grown Free-Standing GaN.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 613, doi. 10.1007/s11664-006-0108-y
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Catalyst-Free Growth of GaN Nanowires.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 576, doi. 10.1007/s11664-006-0102-4
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- Article
Calculations and Measurements of Contact Resistance of Semi-Transparent Ni/Pd Contacts to p-GaN.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 605, doi. 10.1007/s11664-006-0107-z
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- Article
Flat GaN Epitaxial Layers Grown on Si(111) by Metalorganic Vapor Phase Epitaxy Using Step-Graded AlGaN Intermediate Layers.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 592, doi. 10.1007/s11664-006-0105-1
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- Article
Influence of Growth Temperature and Growth Rate of p-GaN Layers on the Characteristics of Green Light Emitting Diodes.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 587, doi. 10.1007/s11664-006-0104-2
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- Article
Schottky Barrier Formation at Nonpolar Au/GaN Epilayer Interfaces.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 581, doi. 10.1007/s11664-006-0103-3
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- Article
Anisotropy in the Quantum Lifetime in AlGaN/GaN Heterostructures.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 599, doi. 10.1007/s11664-006-0106-0
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- Article
Gate Control, Surface Leakage Currents, and Peripheral Charging in AlGaN/GaN Heterostructure Field Effect Transistors Having Nanometer-Scale Schottky Gates.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 568, doi. 10.1007/s11664-006-0101-5
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- Article
Influence of Growth Conditions and Surface Reaction Byproducts on GaN Grown via Metal Organic Molecular Beam Epitaxy: Toward an Understanding of Surface Reaction Chemistry.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 562, doi. 10.1007/s11664-006-0100-6
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- Article
Valency Configuration of Transition Metal Impurities in ZnO.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 556, doi. 10.1007/s11664-006-0099-8
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Thermal Conductivity of Bulk ZnO after Different Thermal Treatments.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 550
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Trap-Related Photoconductivity in ZnO Epilayers.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 543, doi. 10.1007/s11664-006-0097-x
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Polarization, Piezoelectric Constants, and Elastic Constants of ZnO, MgO, and CdO.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 538, doi. 10.1007/s11664-006-0096-y
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- Article
Free Carrier Absorption and Lattice Vibrational Modes in Bulk ZnO.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 525, doi. 10.1007/s11664-006-0094-0
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- Article
Effect of Annealing on Electrical Properties of Radio-Frequency-Sputtered ZnO Films.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 520, doi. 10.1007/s11664-006-0093-1
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Selective and Nonselective Wet Etching of Zn<sub>0.9</sub>Mg<sub>0.1</sub>O/ZnO.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 516, doi. 10.1007/s11664-006-0092-2
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- Article
Synthesis and Characterization of Phosphorus-Doped ZnO and (Zn,Mg)O Thin Films via Pulsed Laser Deposition.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 530, doi. 10.1007/s11664-006-0095-z
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- Article
Electrical Properties of ZnO Nano-Particles Embedded in Polyimide.
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- Journal of Electronic Materials, 2006, v. 35, n. 4, p. 512, doi. 10.1007/s11664-006-0091-3
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- Article