Works matching IS 03615235 AND DT 2005 AND VI 34 AND IP 4
Results: 25
Modification of 4H-SiC and 6H-SiC(0001)<sub>Si</sub> Surfaces through the Interaction with Atomic Hydrogen and Nitrogen.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 457, doi. 10.1007/s11664-005-0127-0
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- Article
Fabrication and Characterization of 4H-SiC P-N Junction Diodes by Selective-Epitaxial Growth Using TaC as the Mask.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 450, doi. 10.1007/s11664-005-0126-1
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A Magnetotransport Study of AlGaN/GaN Heterostructures on Silicon.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 444, doi. 10.1007/s11664-005-0125-2
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Preparation of Ultrasmooth and Defect-Free 4H-SiC(0001) Surfaces by Elastic Emission Machining.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 439, doi. 10.1007/s11664-005-0124-3
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Characteristics of 6H-Silicon Carbide PIN Diodes Prototyping by Laser Doping.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 430, doi. 10.1007/s11664-005-0123-4
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- Article
Crystal Quality of InN Thin Films Grown on ZnO Substrate by Radio-Frequency Molecular Beam Epitaxy.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 424, doi. 10.1007/s11664-005-0122-5
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- Article
Development of MgZnO-ZnO-AlGaN Heterostructures for Ultraviolet Light Emitting Applications.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 416, doi. 10.1007/s11664-005-0121-6
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Properties of Phosphorus-Doped (Zn,Mg)O Thin Films and Device Structures.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 409, doi. 10.1007/s11664-005-0120-7
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Fabrication Approaches to ZnO Nanowire Devices.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 404, doi. 10.1007/s11664-005-0119-0
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- Article
Shallow Donor Generation in ZnO by Remote Hydrogen Plasma.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 399, doi. 10.1007/s11664-005-0118-1
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- Article
Proton Irradiation of ZnO Schottky Diodes.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 395, doi. 10.1007/s11664-005-0117-2
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- Article
Properties of Electrical Contacts on Bulk and Epitaxial n-Type ZnO.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 389, doi. 10.1007/s11664-005-0116-3
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- Article
Cross-Polarization Imaging and Micro-Raman Detection of Defects in the Epitaxy of 4H-SiC.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 382, doi. 10.1007/s11664-005-0115-4
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- Article
Environmental Sensitivity of Au Diodes on n-AlGaN.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 375, doi. 10.1007/s11664-005-0114-5
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- Article
Design of Edge Termination for GaN Power Schottky Diodes.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 370, doi. 10.1007/s11664-005-0113-6
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AIN-Based Dilute Magnetic Semiconductors.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 365, doi. 10.1007/s11664-005-0112-7
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- Article
Superior Suppression of Gate Current Leakage in Al<sub>2</sub>O<sub>3</sub>/Si<sub>3</sub>N<sub>4</sub> Bilayer-Based AlGaN/GaN Insulated Gate Heterostructure Field-Effect Transistors.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 361, doi. 10.1007/s11664-005-0111-8
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- Article
Microstructure and Enhanced Morphology of Planar Nonpolar m-Plane GaN Grown by Hydride Vapor Phase Epitaxy.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 357, doi. 10.1007/s11664-005-0110-9
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SiC Field-Effect Devices Operating at High Temperature.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 345, doi. 10.1007/s11664-005-0108-3
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- Article
Planar Defects in 4H-SiC PiN Diodes.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 351, doi. 10.1007/s11664-005-0109-2
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Drift-Free 10-kV, 20-A 4H-SiC PiN Diodes.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 341, doi. 10.1007/s11664-005-0107-4
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Thermally Stimulated Current Spectroscopy of High-Purity Semi-Insulating 4H-SiC Substrates.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 336, doi. 10.1007/s11664-005-0106-5
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Fast Epitaxial Growth of High-Purity 4H-SiC(0001) in a Vertical Hot-Wall Chemical Vapor Deposition.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 324, doi. 10.1007/s11664-005-0104-7
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Investigation of Longitudinal-Optical Phonon-Plasmon Coupled Modes in SiC Epitaxial Film Using Fourier Transform Infrared Reflection.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 320, doi. 10.1007/s11664-005-0103-8
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Influence of Low-Field-Mobility-Related Issues on SiC Metal-Semiconductor Field-Effect Transistor Performance.
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- Journal of Electronic Materials, 2005, v. 34, n. 4, p. 330, doi. 10.1007/s11664-005-0105-6
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