Works matching IS 03615235 AND DT 2005 AND VI 34 AND IP 11
1
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. L53, doi. 10.1007/s11664-005-0206-2
- Enxia Zhang;
- Jiayin Sun;
- Jing Chen;
- Zhengxuan Zhang;
- Xi Wang;
- Ning Li;
- Guoqiang Zhang;
- Zhongli Liu
- Article
2
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1455, doi. 10.1007/s11664-005-0205-3
- Hwang, J. W.;
- Yim, M. J.;
- Paik, K. W.
- Article
3
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1446, doi. 10.1007/s11664-005-0204-4
- Seung-Hyun Lee;
- Hee-Ra Roh;
- Zhi Gang Chen;
- Young-Ho Kim
- Article
4
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1440, doi. 10.1007/s11664-005-0203-5
- Srivastav, V.;
- Pal, R.;
- Sharma, B. L;
- Naik, A.;
- Rawal, D. S.;
- Gopal, V.;
- Vyas, H. P.
- Article
5
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1432, doi. 10.1007/s11664-005-0202-6
- Hongjin Jiang;
- Kyoung-Sik Moon;
- Jiongxin Lu;
- Wong, C. P.
- Article
6
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1428, doi. 10.1007/s11664-005-0201-7
- Abe, K.;
- Eryu, O.;
- Nakashima, S.;
- Terai, M.;
- Kubo, M.;
- Niraula, M.;
- Yasuda, K.
- Article
7
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1420, doi. 10.1007/s11664-005-0200-8
- Liqiang Cao;
- Shiming Li;
- Zonghe Lai;
- Liu, Johan
- Article
8
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1414, doi. 10.1007/s11664-005-0199-x
- Lianwen Wang;
- Ai-Ping Xian
- Article
9
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1408, doi. 10.1007/s11664-005-0198-y
- Cheng-Shi Chen;
- Chuan-Pu Liu
- Article
10
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1399, doi. 10.1007/s11664-005-0197-z
- Lee, Andre;
- Subramanian, K. N.
- Article
11
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1391, doi. 10.1007/s11664-005-0196-0
- Kim, H. J.;
- Chandola, A.;
- Guha, S.;
- Gonzalez, L.;
- Kumar, V.;
- Dutta, P. S.
- Article
12
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1385, doi. 10.1007/s11664-005-0195-1
- Hui-Min Wu;
- Feng-Chih Wu;
- Tung-Han Chuang
- Article
13
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1378, doi. 10.1007/s11664-005-0194-2
- Priyadarshi, A.;
- Shimin, L.;
- Wong, E. H.;
- Rajoo, R.;
- Mhaisalkar, S. G.;
- Kripesh, V.
- Article
14
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1373, doi. 10.1007/s11664-005-0193-3
- Huang, M. L.;
- Wu, C. M. L.;
- Wang, L.
- Article
15
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1368, doi. 10.1007/s11664-005-0192-4
- Teynor, W. A.;
- Vaccaro, K.;
- Buchwald, W. R.;
- Dauplaise, H. M.;
- Morath, C. P.;
- Davis, A.;
- Roland, M. A.;
- Clark, W. R.
- Article
16
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1363, doi. 10.1007/s11664-005-0191-5
- Article
17
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1357, doi. 10.1007/s11664-005-0190-6
- Tai, F.;
- Guo, F.;
- Xia, Z. D.;
- Lei, Y. P.;
- Yan, Y. F.;
- Liu, J. P.;
- Shi, Y. W.
- Article
