Works matching IS 03615235 AND DT 2004 AND VI 33 AND IP 7
3
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. L15, doi. 10.1007/s11664-004-0251-2
- Chang, H. C.;
- Lee, C. S.;
- Chen, S. H.;
- Chang, E. Y.;
- He, J. Z.
- Article
4
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 833, doi. 10.1007/s11664-004-0250-3
- Boudaa, Mouloud;
- Regreny, P.;
- Leclercq, J. L.;
- Besland, M. P.;
- Marty, O.;
- Hollinger, G.
- Article
5
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 826, doi. 10.1007/s11664-004-0249-9
- Smith, T. P.;
- Mclean, H. A.;
- Smith, David J.;
- Miraglia, P. Q.;
- Roskowski, A. M.;
- Davis, R. F.
- Article
6
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 819, doi. 10.1007/s11664-004-0248-x
- Edrei, R.;
- Shauly, E. N.;
- Roizin, Y.;
- Gridin, V. V.;
- Akhvlediani, R.;
- Hoffman, A.
- Article
7
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 815, doi. 10.1007/s11664-004-0247-y
- Gudkov, V. V.;
- Lonchakov, A. T.;
- Tkach, A. V.;
- Zhevstovskikh, I. V.;
- Sokolov, V. I.;
- Gruzdev, N. B.
- Article
8
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 809, doi. 10.1007/s11664-004-0246-z
- Saini, Sajan;
- Chen, Kevin;
- Xiaoman Duan;
- Michel, Jurgen;
- Kimerling, Lionel C.;
- Lipson, Michal
- Article
9
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 802, doi. 10.1007/s11664-004-0245-0
- Article
10
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 796, doi. 10.1007/s11664-004-0244-1
- Tseng, H. S.;
- Bi-Shiou Chiou;
- Wu, W. F.;
- Ho, C. C.
- Article
11
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 790, doi. 10.1007/s11664-004-0243-2
- Sohn, Y. C.;
- Jin Yu;
- Kang, S. K.;
- Shih, D. Y.;
- Choi, W. K.
- Article
12
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 786, doi. 10.1007/s11664-004-0242-3
- Kyoung-Wan Park;
- Ki-Taek Cho;
- Jin-Yong Ahn;
- Duck-Kyun Choi
- Article
13
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 780, doi. 10.1007/s11664-004-0241-4
- Yang, H. J.;
- Ko, Y. K.;
- Jang, J.;
- Soh, H. S.;
- Chae, G.-S.;
- Hong, H. N.;
- Lee, J. G.
- Article
14
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 774, doi. 10.1007/s11664-004-0240-5
- Tandon, S. N.;
- Gopinath, J. T.;
- Erchak, A. A.;
- Petrich, G. S.;
- Kolodziejski, L. A.;
- Ippen, E. P.
- Article
15
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 770, doi. 10.1007/s11664-004-0239-y
- Yu-Long Jiang;
- Guo-Ping Ru;
- Jian-Hai Liu;
- Xin-Ping Qu;
- Bing-Zong Li
- Article
16
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 767, doi. 10.1007/s11664-004-0238-z
- Alzanki, T.;
- Gwilliam, R.;
- Emerson, N. G.;
- Sealy, B. J.
- Article