Works matching IS 03615235 AND DT 2004 AND VI 33 AND IP 6
Results: 45
Determination of Individual Layer Composition and Thickness in Multilayer HgCdTe Structures.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 761, doi. 10.1007/s11664-004-0079-9
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- Article
Investigations into the Source of 1/f Noise in Hg<sub>x</sub>Cd<sub>1-x</sub>Te Diodes.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 757, doi. 10.1007/s11664-004-0078-x
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- Article
Molecular Beam Epitaxy Growth of High-Quality Arsenic-Doped HgCdTe.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 752, doi. 10.1007/s11664-004-0077-y
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- Article
Development of the High-Pressure Electro-Dynamic Gradient Crystal-Growth Technology for Semi-Insulating CdZnTe Growth for Radiation Detector Applications.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 742, doi. 10.1007/s11664-004-0076-z
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- Article
Concentrations of Native and Gold Defects in HgCdTe from First Principles Calculations.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 737, doi. 10.1007/s11664-004-0075-0
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- Article
Fundamental Materials Studies of Undoped, In-Doped, and As-Doped Hg<sub>1-x</sub>Cd<sub>x</sub>Te.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 728, doi. 10.1007/s11664-004-0074-1
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- Article
Optical Properties of CdSe<sub>x</sub>Te<sub>1-x</sub> Epitaxial Films Studied by Spectroscopic Ellipsometry.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 724, doi. 10.1007/s11664-004-0073-2
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- Article
Experimental Study of Non-Stoichiometry in Cd<sub>1-x</sub>Zn<sub>x</sub>Te<sub>1±δ</sub>.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 719, doi. 10.1007/s11664-004-0072-3
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- Article
High-Resolution Mapping of Infrared Photoluminescence.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 714, doi. 10.1007/s11664-004-0071-4
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- Article
Near-Bandgap Infrared Absorption Properties of HgCdTe.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 709, doi. 10.1007/s11664-004-0070-5
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- Article
Optical-Absorption Model for Molecular-Beam Epitaxy HgCdTe and Application to Infrared Detector Photoresponse.
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- 2004
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- Publication type:
- Abstract
Study of the Pixel-Pitch Reduction for HgCdTe Infrared Dual-Band Detectors.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 690, doi. 10.1007/s11664-004-0068-z
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- Publication type:
- Article
Macro-Loading Effects of Electron-Cyclotron Resonance Etched II-VI Materials.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 684, doi. 10.1007/s11664-004-0067-0
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- Article
Application of Quantitative Mobility-Spectrum Analysis to Multilayer HgCdTe Structures.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 673, doi. 10.1007/s11664-004-0066-1
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- Publication type:
- Article
Physical Structure of Molecular-Beam Epitaxy Growth Defects in HgCdTe and Their Impact on Two-Color Detector Performance.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 662, doi. 10.1007/s11664-004-0064-3
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- Article
Dual-Band Infrared Detectors Made on High-Quality HgCdTe Epilayers Grown by Molecular Beam Epitaxy on CdZnTe or CdTe/Ge Substrates.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 667, doi. 10.1007/s11664-004-0065-2
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- Article
Differential Thermal Analysis of Supercooling in CdTe.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 658, doi. 10.1007/s11664-004-0063-4
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- Article
ZnO Nanotips Grown on Si Substrates by Metal-Organic Chemical-Vapor Deposition.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 654, doi. 10.1007/s11664-004-0062-5
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- Article
Growth of Large-Diameter ZnTe Single Crystals by Liquid-Encapsulated Melt Growth Methods.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 651, doi. 10.1007/s11664-004-0061-6
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- Article
Growth of Thick CdTe Epilayers on GaAs Substrates and Evaluation of CdTe/n<sup>+</sup> -GaAs Heterojunction Diodes for an X-ray Imaging Detector.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 645, doi. 10.1007/s11664-004-0060-7
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- Article
Distribution of the High Resistivity Region in CdZnTe and Its Effects on Gamma-Ray Detector Performance.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 640, doi. 10.1007/s11664-004-0059-0
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- Article
HgCdTe Electron Avalanche Photodiodes.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 630, doi. 10.1007/s11664-004-0058-1
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- Article
Dark Currents in Long Wavelength Infrared HgCdTe Gated Photodiodes.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 621, doi. 10.1007/s11664-004-0057-2
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- Article
Performance Characteristics of Planar Ion-Implantation Isolated Heterojunction, Near-Infrared, and Short-Wave Infrared HgCdTe Devices.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 615, doi. 10.1007/s11664-004-0056-3
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- Article
Advanced Thermoelectrically Cooled Midwave HgCdTe Focal Plane Arrays.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 609, doi. 10.1007/s11664-004-0055-4
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- Article
Resonant Cavity-Enhanced Mercury Cadmium Telluride Detectors.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 604, doi. 10.1007/s11664-004-0054-5
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- Article
A 5 mm x 5 mm Mid-Wavelength Infrared HgCdTe Photodiode Array with Negative Luminescence Efficiency ∼95%.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 600, doi. 10.1007/s11664-004-0053-6
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- Article
Li Diffusion in Epitaxial (1120) ZnO Thin Films.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 596, doi. 10.1007/s11664-004-0052-7
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- Article
Arsenic-Doped Mid-Wavelength Infrared HgCdTe Photodiodes.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 590, doi. 10.1007/s11664-004-0051-8
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- Article
In-Situ Ellipsometry Studies of Adsorption of Hg on CdTe(211)B/Si(211) and Molecular Beam Epitaxy Growth of HgCdTe(211)B.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 583, doi. 10.1007/s11664-004-0050-9
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- Article
Annealing Effects of a High-Quality ZnTe Substrate.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 579, doi. 10.1007/s11664-004-0049-2
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- Article
Laser-Beam-Induced Current Mapping of Spatial Nonuniformities in Molecular Beam Epitaxy As-Grown HgCdTe.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 572, doi. 10.1007/s11664-004-0048-3
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- Article
Correlation of Laser-Beam-Induced Current with Current-Voltage Measurements in HgCdTe Photodiodes.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 560, doi. 10.1007/s11664-004-0047-4
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- Article
Wet-Chemical Etching of (1120) ZnO Films.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 556, doi. 10.1007/s11664-004-0046-5
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- Article
Wafer Bonding of (211) Cd<sub>0.96</sub>Zn<sub>0.04</sub>Te on (001) Silicon.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 552, doi. 10.1007/s11664-004-0045-6
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- Article
Determination of the Ion Angular Distribution for Electron Cyclotron Resonance, Plasma-Etched HgCdTe Trenches.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 543, doi. 10.1007/s11664-004-0044-7
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- Article
Processing and Characterization of a-Si:H Photoresists for a Vacuum-Compatible Photolithography Process.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 538, doi. 10.1007/s11664-004-0043-8
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- Article
Long Wavelength Infrared, Molecular Beam Epitaxy, HgCdTe-on-Si Diode Performance.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 531, doi. 10.1007/s11664-004-0042-9
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- Article
HgCdTe/Si Materials for Long Wavelength Infrared Detectors.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 526, doi. 10.1007/s11664-004-0041-x
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- Publication type:
- Article
Spectral Crosstalk by Radiative Recombination in Sequential-Mode, Dual Mid-Wavelength Infrared Band HgCdTe Detectors.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 517, doi. 10.1007/s11664-004-0040-y
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- Publication type:
- Article
HgCdTe Focal Plane Arrays for Dual-Color Mid- and Long-Wavelength Infrared Detection.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 509, doi. 10.1007/s11664-004-0039-4
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- Article
HgTe/HgCdTe Superlattices Grown on CdTe/Si by Molecular Beam Epitaxy for Infrared Detection.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 503, doi. 10.1007/s11664-004-0038-5
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- Article
Molecular Beam Epitaxial Growth of Cd<sub>1-y</sub>Zn<sub>y</sub>Se<sub>x</sub>Te<sub>1-x</sub> on Si(211).
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 498, doi. 10.1007/s11664-004-0037-6
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- Article
Feasibility Study of Cadmium Zinc Telluride Growth Using a Submerged Heater in a Vertical Bridgman System.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 488, doi. 10.1007/s11664-004-0036-7
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- Article
Foreword.
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- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 487, doi. 10.1007/s11664-004-0035-8
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- Article