Works matching IS 03615235 AND DT 2004 AND VI 33 AND IP 4
1
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. L5, doi. 10.1007/s11664-004-0147-1
- Chakrabarti, S.;
- Fathpour, S.;
- Moazzami, K.;
- Phillips, J.;
- Lei, Y.;
- Browning, N.;
- Bhattacharya, P.
- Article
2
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 374, doi. 10.1007/s11664-004-0146-2
- Chuang, T. H.;
- Huang, K. W.;
- Lin, W. H.
- Article
3
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 368, doi. 10.1007/s11664-004-0145-3
- Chen, Chi-Tong;
- Chiou, Bi-Shiou
- Article
4
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 364, doi. 10.1007/s11664-004-0144-4
- Oh, Jungwoo;
- Campbell, Joe C.
- Article
5
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 358, doi. 10.1007/s11664-004-0143-5
- Lee, J. W.;
- Lim, W. T.;
- Baek, I. K.;
- Yoo, S. R.;
- Jeon, M. H.;
- Cho, G. S.;
- PEARTON, S. J.
- Article
6
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 353, doi. 10.1007/s11664-004-0142-6
- Shahrjerdi, D.;
- Hekmatshoar, B.;
- Mohajerzadeh, S. S.;
- Khakifirooz, A.;
- Robertson, M.
- Article
7
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 340, doi. 10.1007/s11664-004-0141-7
- Noolu, Naren;
- Murdeshwar, Nikhil;
- Ely, Kevin;
- Lippold, John;
- Baeslack III, William
- Article
8
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 334, doi. 10.1007/s11664-004-0140-8
- Estragnat, E.;
- Tang, G.;
- Liang, H.;
- Jahanmir, S.;
- Pei, P.;
- Martin, J. M.
- Article
9
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 329, doi. 10.1007/s11664-004-0139-1
- Kanchanomai, C.;
- Mutoh, Y.
- Article
10
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 321, doi. 10.1007/s11664-004-0138-2
- Kariya, Yoshiharu;
- Hosoi, Takuya;
- Terashima, Shinichi;
- Tanaka, Masamoto;
- Otsuka, Masahisa
- Article
11
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 312, doi. 10.1007/s11664-004-0137-3
- Yongtaek Hong;
- Zhiqi He;
- Lennhoff, Nancy S.;
- Banach, David A.;
- Kanicki, Jerzy
- Article
12
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 300, doi. 10.1007/s11664-004-0136-4
- Jong-Ning Aoh;
- Cheng-Li Chuang
- Article
13
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 290, doi. 10.1007/s11664-004-0135-5
- Jong-Ning Aoh;
- Cheng-Li Chuang
- Article
14
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 283, doi. 10.1007/s11664-004-0134-6
- Chien-Sheng Huang;
- Guh-Yaw Jang;
- Jenq-Gong Duh
- Article
15
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 277, doi. 10.1007/s11664-004-0133-7
- Jong-Hyun Lee;
- Yong-Seong Eom;
- Kwang-Seong Choi;
- Byung-Seok Choi;
- Ho-Gyeong Yoon;
- Jong-Tae Moon;
- Yong-Seog Kim
- Article
16
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 271, doi. 10.1007/s11664-004-0132-8
- Lay Kuan Teh;
- Chee Cheong Wong;
- Mhaisalkar, Subodh;
- Ong, Kristine;
- Poi Siong Teo;
- Fe Hua Wong
- Article
17
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 258, doi. 10.1007/s11664-004-0131-9
- Dutta, I.;
- Majumdar, B. S.;
- Pan, D.;
- Horton, W. S.;
- Wright, W.;
- Wang, Z. X.
- Article
18
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 249, doi. 10.1007/s11664-004-0130-x
- Lee, K. O.;
- Yu, Jin;
- Park, T. S.;
- Lee, S. B.
- Article