Works matching IS 03233847 AND DT 2010 AND VI 52 AND IP 3
1
- Biometrical Journal, 2010, v. 52, n. 3, p. 333, doi. 10.1002/bimj.200900242
- Subtil, Fabien;
- Rabilloud, Muriel
- Article
2
- Biometrical Journal, 2010, v. 52, n. 3, p. 377, doi. 10.1002/bimj.200900114
- Jensen, Katrin;
- Kieser, Meinhard
- Article
3
- Biometrical Journal, 2010, v. 52, n. 3, p. 417, doi. 10.1002/bimj.200900228
- Article
4
- Biometrical Journal, 2010, v. 52, n. 3, p. 438, doi. 10.1002/bimj.201000094
- Yu, Jihnhee;
- Kepner, James L.;
- Iyer, Renuka
- Article
5
- Biometrical Journal, 2010, v. 52, n. 3, p. 348, doi. 10.1002/bimj.200900131
- Vexler, Albert;
- Yu, Jihnhee;
- Tian, Lili;
- Liu, Shuling
- Article
6
- Biometrical Journal, 2010, v. 52, n. 3, p. 297, doi. 10.1002/bimj.200900182
- Bello, Nora M.;
- Steibel, Juan P.;
- Tempelman, Robert J.
- Article
7
- Biometrical Journal, 2010, v. 52, n. 3, p. 314, doi. 10.1002/bimj.200900135
- Song, Xin-Yuan;
- Pan, Jun-Hao;
- Kwok, Timothy;
- Vandenput, Liesbeth;
- Ohlsson, Claes;
- Leung, Ping-Chung
- Article
8
- Biometrical Journal, 2010, v. 52, n. 3, p. 400, doi. 10.1002/bimj.200900014
- Pinheiro, Hildete P.;
- Kiihl, Samara F.;
- Pinheiro, Aluísio;
- dos Reis, Sérgio F.
- Article
9
- Biometrical Journal, 2010, v. 52, n. 3, p. 362, doi. 10.1002/bimj.200900139
- Chen, Jianwei;
- Lin, Chii-Dean
- Article
10
- Biometrical Journal, 2010, v. 52, n. 3, p. 442, doi. 10.1002/bimj.201000053
- Article
11
- Biometrical Journal, 2010, v. 52, n. 3, p. 295, doi. 10.1002/bimj.201090002
- Article
12
- Biometrical Journal, 2010, v. 52, n. 3, p. 436, doi. 10.1002/bimj.201000012
- Article
13
- Biometrical Journal, 2010, v. 52, n. 3, p. 440, doi. 10.1002/bimj.201000091
- Article