Works matching IS 03233847 AND DT 2002 AND VI 44 AND IP 8
1
- Biometrical Journal, 2002, v. 44, n. 8, p. 982, doi. 10.1002/bimj.200290009
- Moon, Hojin;
- Ahn, Hongshik;
- Kodell, Ralph L.
- Article
2
- Biometrical Journal, 2002, v. 44, n. 8, p. 946, doi. 10.1002/bimj.200290006
- Bratcher, Thomas L.;
- Stamey, James D.
- Article
3
- Biometrical Journal, 2002, v. 44, n. 8, p. 957, doi. 10.1002/bimj.200290007
- Article
4
- Biometrical Journal, 2002, v. 44, n. 8, p. 1041, doi. 10.1002/bimj.200290003
- Article
5
- Biometrical Journal, 2002, v. 44, n. 8, p. 1015, doi. 10.1002/bimj.200290001
- Pflüger, Rafael;
- Hothorn, Torsten
- Article
6
- Biometrical Journal, 2002, v. 44, n. 8, p. 921, doi. 10.1002/bimj.200290004
- Renard, Didier;
- Geys, Helena;
- Molenberghs, Geert;
- Burzykowski, Tomasz;
- Buyse, Marc
- Article
7
- Biometrical Journal, 2002, v. 44, n. 8, p. 936, doi. 10.1002/bimj.200290005
- Jarner, Mikala F.;
- Diggle, Peter;
- Chetwynd, Amanda G.
- Article
8
- Biometrical Journal, 2002, v. 44, n. 8, p. 969, doi. 10.1002/bimj.200290008
- Liu, Jen-Pei;
- Hsueh, Hueymiin;
- Chen, James J.
- Article
9
- Biometrical Journal, 2002, v. 44, n. 8, p. 1002, doi. 10.1002/bimj.200290000
- Peng, Yingwei;
- Carriere, K.C.
- Article
10
- Biometrical Journal, 2002, v. 44, n. 8, p. 1028, doi. 10.1002/bimj.200290002
- Singh, Housila P.;
- Shukla, Sushil K.;
- Singh, Sarjinder
- Article