Works matching IS 03233847 AND DT 2000 AND VI 42 AND IP 7
1
- Biometrical Journal, 2000, v. 42, n. 7, p. 795, doi. 10.1002/1521-4036(200011)42:7<795::AID-BIMJ795>3.0.CO;2-G
- Tang, Man-Lai;
- Chan, Ping-Shing;
- Chan, Wai
- Article
2
- Biometrical Journal, 2000, v. 42, n. 7, p. 901, doi. 10.1002/1521-4036(200011)42:7<901::AID-BIMJ901>3.0.CO;2-N
- Lo, Pei-Chen;
- Chung, Wen-Po
- Article
3
- Biometrical Journal, 2000, v. 42, n. 7, p. 823, doi. 10.1002/1521-4036(200011)42:7<823::AID-BIMJ823>3.0.CO;2-B
- Article
4
- Biometrical Journal, 2000, v. 42, n. 7, p. 855, doi. 10.1002/1521-4036(200011)42:7<855::AID-BIMJ855>3.0.CO;2-S
- Viana, Marlos A.G.;
- Pereira, Carlos A. De B.
- Article
5
- Biometrical Journal, 2000, v. 42, n. 7, p. 887, doi. 10.1002/1521-4036(200011)42:7<887::AID-BIMJ887>3.0.CO;2-8
- Article
6
- Biometrical Journal, 2000, v. 42, n. 7, p. 865, doi. 10.1002/1521-4036(200011)42:7<865::AID-BIMJ865>3.0.CO;2-O
- Tikkiwal, G.C.;
- Ghiya, Alka
- Article
7
- Biometrical Journal, 2000, v. 42, n. 7, p. 807, doi. 10.1002/1521-4036(200011)42:7<807::AID-BIMJ807>3.0.CO;2-3
- Lesaffre, Emmanuel;
- Todem, David;
- Verbeke, Geert;
- Kenward, Mike
- Article
8
- Biometrical Journal, 2000, v. 42, n. 7, p. 895, doi. 10.1002/1521-4036(200011)42:7<895::AID-BIMJ895>3.0.CO;2-C
- Article
9
- Biometrical Journal, 2000, v. 42, n. 7, p. 837, doi. 10.1002/1521-4036(200011)42:7<837::AID-BIMJ837>3.0.CO;2-S
- Munzel, Ullrich;
- Brunner, Edgar
- Article
10
- Biometrical Journal, 2000, v. 42, n. 7, p. 877, doi. 10.1002/1521-4036(200011)42:7<877::AID-BIMJ877>3.0.CO;2-C
- Chan, Wenyaw;
- Peng, Nan Fu
- Article