Ion/ion chemistry of high-mass multiply charged ions.
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- Mass Spectrometry Reviews, 1999, v. 18, n. 1, p. 83, doi. 10.1002/(SICI)1098-2787(1999)18:1<83::AID-MAS4>3.0.CO;2-N
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Works matching IS 02777037 AND DT 1999 AND VI 18 AND IP 1
Results: 4
1
2
Selected reviews on mass spectrometric topics.
- Published in:
- Mass Spectrometry Reviews, 1999, v. 18, n. 1, p. 82, doi. 10.1002/(SICI)1098-2787(1999)18:1<82::AID-MAS3>3.0.CO;2-T
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3
Static secondary ion mass spectrometry (S-SIMS) Part 2: material science applications.
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- Mass Spectrometry Reviews, 1999, v. 18, n. 1, p. 48, doi. 10.1002/(SICI)1098-2787(1999)18:1<48::AID-MAS2>3.0.CO;2-I
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- Article
4
Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation.
- Published in:
- Mass Spectrometry Reviews, 1999, v. 18, n. 1, p. 1, doi. 10.1002/(SICI)1098-2787(1999)18:1<1::AID-MAS1>3.0.CO;2-W
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- Article