Works matching IS 02724332 AND DT 2010 AND VI 30 AND IP 1
1
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 143, doi. 10.1111/j.1539-6924.2009.01306.x
- Nakayachi, Kazuya;
- Cvetkovich, George
- Article
2
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 65, doi. 10.1111/j.1539-6924.2009.01313.x
- Rivers, Louie;
- Arvai, Joseph;
- Slovic, Paul
- Article
3
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 32, doi. 10.1111/j.1539-6924.2009.01319.x
- Parnell, Gregory S.;
- Smith, Christopher M.;
- Moxley, Frederick I.
- Article
4
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 49, doi. 10.1111/j.1539-6924.2009.01321.x
- Pintar, K. D. M.;
- Fazil, A.;
- Pollari, F.;
- Charron, D. F.;
- Waltner‐Toews, D.;
- McEwen, S. A.
- Article
5
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 95, doi. 10.1111/j.1539-6924.2009.01335.x
- Sjöberg, Lennart;
- Engelberg, Elisabeth
- Article
6
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 20, doi. 10.1111/j.1539-6924.2009.01338.x
- Rijgersberg, Hajo;
- Tromp, Seth;
- Jacxsens, Liesbeth;
- Uyttendaele, Mieke
- Article
7
- 2010
- Greenberg, Michael;
- Lowrie, Karen
- Other
8
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 125, doi. 10.1111/j.1539-6924.2009.01320.x
- De Jonge, Janneke;
- Van Trijp, Hans;
- Renes, Reint Jan;
- Frewer, Lynn J.
- Article
9
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 7, doi. 10.1111/j.1539-6924.2009.01322.x
- Rimbaud, Loup;
- Heraud, Fanny;
- La Vieille, Sébastien;
- Leblanc, Jean‐Charles;
- Crepet, Amélie
- Article
10
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 107, doi. 10.1111/j.1539-6924.2009.01325.x
- Elmer, Florian;
- Seifert, Isabel;
- Kreibich, Heidi;
- Thieken, Annegret H.
- Article
11
- Risk Analysis: An International Journal, 2010, v. 30, n. 1, p. 78, doi. 10.1111/j.1539-6924.2009.01331.x
- Tesfamariam, Solomon;
- Sadiq, Rehan;
- Najjaran, Homayoun
- Article
13
- 2010
- Greenberg, Michael;
- Lowrie, Karen
- Editorial