Works matching IS 02724332 AND DT 2000 AND VI 20 AND IP 1
1
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 27, doi. 10.1111/0272-4332.00003
- Article
2
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 49, doi. 10.1111/0272-4332.00005
- Morgan, M.G.;
- Florig, H.K.;
- deKay, M.L.;
- Fischbeck, P.
- Article
3
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 59, doi. 10.1111/0272-4332.00006
- Voit, E.O.;
- Schwacke, L.H.
- Article
4
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 13, doi. 10.1111/0272-4332.00002
- Lindell, M.K.;
- Whitney, D.J.
- Article
5
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 41, doi. 10.1111/0272-4332.00004
- Ginsberg, Gary L.;
- Toal, Brian F.
- Article
6
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 1, doi. 10.1111/0272-4332.00001
- Article
7
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 73, doi. 10.1111/0272-4332.00007
- Tsongas, T.;
- Orlinskii, D.;
- Priputina, I.;
- Pleskachevskaya, G.;
- Fetishchev, A.;
- Hinman, G.;
- Butcher, W.
- Article
8
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 81, doi. 10.1111/0272-4332.00008
- Gaylor, D. W.;
- Culp, S. J.;
- Goldstein, L. S.;
- Beland, F. A.
- Article
9
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 87, doi. 10.1111/0272-4332.00009
- Bartell, S.M.;
- Ponce, R.A.;
- Takaro, T.K.;
- Zerbe, R.O.;
- Omenn, G.S.;
- Faustman, E.M.
- Article
10
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 101, doi. 10.1111/0272-4332.00010
- Frohmberg, E.;
- Goble, R.;
- Sanchez, V.;
- Quigley, D.
- Article
11
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 113, doi. 10.1111/0272-4332.00011
- Frohwein, H.I.;
- Lambert, J.H.
- Article
12
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 125, doi. 10.1111/0272-4332.00012
- Frohwein, H.I.;
- Haimes, Y.Y.;
- Lambert, J.H.
- Article
13
- Risk Analysis: An International Journal, 2000, v. 20, n. 1, p. 135, doi. 10.1111/0272-4332.00013
- Kirman, C.R.;
- Hays, S.M.;
- Kedderis, G.L.;
- Gargas, M.L.;
- Strother, D.E.
- Article