Works matching IS 02655322 AND DT 2023 AND VI 40 AND IP 1
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- Language Testing, 2023, v. 40, n. 1, p. 204, doi. 10.1177/02655322221138339
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- Language Testing, 2023, v. 40, n. 1, p. 15, doi. 10.1177/02655322221127896
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- Language Testing, 2023, v. 40, n. 1, p. 47, doi. 10.1177/02655322221127421
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- Language Testing, 2023, v. 40, n. 1, p. 31, doi. 10.1177/02655322221127365
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- Language Testing, 2023, v. 40, n. 1, p. 24, doi. 10.1177/02655322221126607
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- Language Testing, 2023, v. 40, n. 1, p. 54, doi. 10.1177/02655322221126606
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- Language Testing, 2023, v. 40, n. 1, p. 40, doi. 10.1177/02655322221125698
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- Language Testing, 2023, v. 40, n. 1, p. 8, doi. 10.1177/02655322221125204
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- Language Testing, 2023, v. 40, n. 1, p. 61, doi. 10.1177/02655322221076025
- Chan, Kinnie Kin Yee;
- Bond, Trevor;
- Yan, Zi
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16
- Language Testing, 2023, v. 40, n. 1, p. 153, doi. 10.1177/02655322221074913
- Yan, Xun;
- Chuang, Ping-Lin
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17
- Language Testing, 2023, v. 40, n. 1, p. 86, doi. 10.1177/02655322211070840
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- Language Testing, 2023, v. 40, n. 1, p. 133, doi. 10.1177/02655322211064629
- Bo, Wenjin Vikki;
- Fu, Mingchen;
- Lim, Wei Ying
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- Language Testing, 2023, v. 40, n. 1, p. 107, doi. 10.1177/02655322211062138
- Alpizar, David;
- Li, Tongyun;
- Norris, John M.;
- Gu, Lixiong
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