Works matching IS 02655322 AND DT 2016 AND VI 33 AND IP 4
3
- Language Testing, 2016, v. 33, n. 4, p. 497, doi. 10.1177/0265532215594643
- Yan, Xun;
- Maeda, Yukiko;
- Lv, Jing;
- Ginther, April
- Article
4
- Language Testing, 2016, v. 33, n. 4, p. 555, doi. 10.1177/0265532215594642
- Harsch, Claudia;
- Hartig, Johannes
- Article
5
- Language Testing, 2016, v. 33, n. 4, p. 577, doi. 10.1177/0265532215594641
- Chen, Fang;
- Chalhoub-Deville, Micheline
- Article
6
- Language Testing, 2016, v. 33, n. 4, p. 529, doi. 10.1177/0265532215594640
- Aryadoust, Vahid;
- Zhang, Limei
- Article
7
- Language Testing, 2016, v. 33, n. 4, p. 453, doi. 10.1177/0265532215593312
- Chalhoub-Deville, Micheline
- Article
8
- Language Testing, 2016, v. 33, n. 4, p. 473, doi. 10.1177/0265532215590849
- Bochner, Joseph H.;
- Samar, Vincent J.;
- Hauser, Peter C.;
- Garrison, Wayne M.;
- Searls, J. Matt;
- Sanders, Cynthia A.
- Article