Works matching IS 02655322 AND DT 2010 AND VI 27 AND IP 4
1
- Language Testing, 2010, v. 27, n. 4, p. 515, doi. 10.1177/0265532210368717
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2
- Language Testing, 2010, v. 27, n. 4, p. 637, doi. 10.1177/0265532210384666
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3
- Language Testing, 2010, v. 27, n. 4, p. 631, doi. 10.1177/0265532210384265
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4
- Language Testing, 2010, v. 27, n. 4, p. 443, doi. 10.1177/0265532210367633
- Chapelle, Carol A.;
- Chung, Yoo-Ree;
- Hegelheimer, Volker;
- Pendar, Nick;
- Xu, Jing
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5
- Language Testing, 2010, v. 27, n. 4, p. 585, doi. 10.1177/0265532210364049
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6
- Language Testing, 2010, v. 27, n. 4, p. 471, doi. 10.1177/0265532209356790
- Currie, Michael;
- Chiramanee, Thanyapa
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7
- Language Testing, 2010, v. 27, n. 4, p. 627, doi. 10.1177/0265532210373604
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8
- Language Testing, 2010, v. 27, n. 4, p. 640, doi. 10.1177/02655322100270041104
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9
- Language Testing, 2010, v. 27, n. 4, p. 493, doi. 10.1177/0265532209355668
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10
- Language Testing, 2010, v. 27, n. 4, p. 639, doi. 10.1177/02655322100270041103
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11
- Language Testing, 2010, v. 27, n. 4, p. 537, doi. 10.1177/0265532209354771
- Fitzpatrick, Tess;
- Clenton, Jon
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12
- Language Testing, 2010, v. 27, n. 4, p. 555, doi. 10.1177/0265532209351431
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13
- Language Testing, 2010, v. 27, n. 4, p. 639, doi. 10.1177/02655322100270041102
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14
- Language Testing, 2010, v. 27, n. 4, p. 603, doi. 10.1177/0265532209355669
- Heilmann, John;
- Miller, Jon F.;
- Nockerts, Ann
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