Works matching IS 0263-8762 AND VI 91 AND IP 1 AND DT 2013


Results: 19
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    Statistical root cause analysis of novel faults based on digraph models.

    Published in:
    Chemical Engineering Research & Design: Transactions of the Institution of Chemical Engineers Part A, 2013, v. 91, n. 1, p. 87, doi. 10.1016/j.cherd.2012.06.010
    By:
    • Yiming Wan;
    • Fan Yang;
    • Ning Lv;
    • Haipeng Xu;
    • Hao Ye;
    • Weichang Li;
    • Peng Xu;
    • Liming Song;
    • Usadi, Adam K.
    Publication type:
    Article
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