Works matching IS 02179849 AND DT 2001 AND VI 15 AND IP 28/29
Results: 21
Plasma Source Ion Implantation into Insulators.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1321, doi. 10.1142/S0217984901003226
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- Article
Ion-Beam Control of Thin-Film Microstructural Columnar Angle.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1328, doi. 10.1142/S0217984901003238
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- Article
Applications of Ion Beam Analysis to the Elemental and Isotopic Characterisation of Advanced Materials.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1271, doi. 10.1142/S0217984901003160
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- Article
High Resolution IBA Analysis of Spin Dependent Tunnel Junctions.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1288, doi. 10.1142/S0217984901003184
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- Article
Optical Doping of Nitrides by Ion Implantation.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1281, doi. 10.1142/S0217984901003172
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- Article
BRS Analysis of MBE Grown SiGe/(001)Si Heterostructures with Thin High Ge Content SiGe Channels for HMOS Transistors.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1297, doi. 10.1142/S0217984901003196
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- Article
Use of IBA Techniques for the Measurement of Oxidation Processes in Sialon Ceramics.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1305, doi. 10.1142/S0217984901003202
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- Article
Characterization of Superconducting Multilayered Films Using RBS and TEM.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1314, doi. 10.1142/S0217984901003214
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- Article
Probing for Fluorine in Nitrided SiO[sub 2] Films by Ion Beam Analysis.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1332, doi. 10.1142/S021798490100324X
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- Article
A Procedure for Gold Soldering Using a Si-Au Alloy Produced by Si Implantation in Au.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1339, doi. 10.1142/S0217984901003251
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- Article
Influence of Helium Co-Implantation on the Formation of Gold Nanoclusters in Lithium Niobate.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1348, doi. 10.1142/S0217984901003263
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- Article
Effect of Ion-Energy on the Properties of Amorphous GaN Films Produced by Ion-Assisted Deposition.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1355, doi. 10.1142/S0217984901003275
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- Article
Use of Ion Beam Analysis to Study In Situ the Oxygen Diffusion and Interfacial Transfer Coefficients in Y[sub 1]Ba[sub 2]Cu[sub 3]O[sub 7-x] Thin Films.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1361
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- Article
Influence of Oxygen Impurities on Ion Beam Induced Interdiffusion in Thin Au-Al Multilayers Deposited on Different Substrates.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1370, doi. 10.1142/S0217984901003299
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- Article
Uptake of Light Elements in Thin Metallic Films.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1382, doi. 10.1142/S0217984901003305
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- Article
Gas-Bubble Ordering in Nanoporous Surface Formation in Helium-Implanted Metals.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1391, doi. 10.1142/S0217984901003317
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Complementary Techniques to High Energy Ion Beam Analysis.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1402, doi. 10.1142/S0217984901003329
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- Article
In Situ Ion Beam Analysis of Chemical and Plasma Etching of Si.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1419, doi. 10.1142/S0217984901003342
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- Article
Characterisation of Conducting Polymers Using Ion Beam Analysis.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1411, doi. 10.1142/S0217984901003330
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- Article
Use of IBA Techniques to Characterize High Velocity Thermal Spray Coatings.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1428, doi. 10.1142/S0217984901003354
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- Article
Defect Transformations at Low Temperatures in Al[sub x]Ga[sub 1-x]As Compound Semiconductors.
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- Modern Physics Letters B, 2001, v. 15, n. 28/29, p. 1437, doi. 10.1142/S0217984901003366
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- Article