Works matching IS 02179792 AND DT 2005 AND VI 19 AND IP 23
Results: 8
CHARACTERISTICS OF DEFECT STATES IN ONE-DIMENSIONAL PHOTONIC CRYSTALS CONTAINING MULTIPLE PHOTONIC QUANTUM-WELLS.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2005, v. 19, n. 23, p. 3519, doi. 10.1142/S0217979205032231
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RAMAN SCATTERING STUDIES ON THE STRUCTURAL PROPERTIES OF PULSED LASER DEPOSITED AMORPHOUS CARBON NITRIDE THIN FILMS.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2005, v. 19, n. 23, p. 3527, doi. 10.1142/S0217979205032309
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THREE-WAVE SOLITON EXCITATIONS IN A DISK-SHAPED BOSE–EINSTEIN CONDENSATE.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2005, v. 19, n. 23, p. 3563, doi. 10.1142/S0217979205032322
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POSITIONAL ORDER OF THE PINNED ABRIKOSOV FLUX LINE LATTICE IN SAMPLES OF FINITE THICKNESS.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2005, v. 19, n. 23, p. 3575, doi. 10.1142/S0217979205032334
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CHAOS SYNCHRONIZATION IN THE MULTIFEEDBACK MACKEY–GLASS MODEL.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2005, v. 19, n. 23, p. 3613, doi. 10.1142/S0217979205032346
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ELECTRICAL BEHAVIOR OF SOME LANTHANUM-BASED RARE EARTH CMR MATERIALS.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2005, v. 19, n. 23, p. 3619, doi. 10.1142/S021797920503236X
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COMPARISONS OF NEGATIVE REFRACTION IN LEFT-HANDED MATERIALS AND PHOTONIC CRYSTALS.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2005, v. 19, n. 23, p. 3547, doi. 10.1142/S0217979205032371
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VALENCE AND METAL-INSULATOR TRANSITIONS IN THE SPINLESS FALICOV–KIMBALL MODEL INDUCED BY DOPING.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2005, v. 19, n. 23, p. 3603
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- Article