Works matching IS 01787675 AND DT 2008 AND VI 42 AND IP 4


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    Materials integrity in microsystems: a framework for a petascale predictive-science-based multiscale modeling and simulation system.

    Published in:
    Computational Mechanics, 2008, v. 42, n. 4, p. 485, doi. 10.1007/s00466-008-0267-1
    By:
    • To, Albert;
    • Liu, Wing;
    • Olson, Gregory;
    • Belytschko, Ted;
    • Chen, Wei;
    • Shephard, Mark;
    • Chung, Yip-Wah;
    • Ghanem, Roger;
    • Voorhees, Peter;
    • Seidman, David;
    • Wolverton, Chris;
    • Chen, J.;
    • Moran, Brian;
    • Freeman, Arthur;
    • Tian, Rong;
    • Luo, Xiaojuan;
    • Lautenschlager, Eric;
    • Challoner, A.
    Publication type:
    Article
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