Works matching IS 01718096 AND DT 2015 AND VI 82 AND IP 6
Results: 7
Analyse von Kristallen mit ETV-ICP OES Analysis of crystals with ETV-ICP OES.
- Published in:
- Technisches Messen, 2015, v. 82, n. 6, p. 339, doi. 10.1515/teme-2014-0029
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- Article
Determination of the uncertainty of the measurements performed by coordinate measuring machines.
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- Technisches Messen, 2015, v. 82, n. 6, p. 329, doi. 10.1515/teme-2014-0034
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- Article
Interferometrische Rundlauffehlerbestimmung von Drehtischen für die optische Rundheitsmessung Concentric run-out error determination of rotary tables with an interferometric probe head.
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- Technisches Messen, 2015, v. 82, n. 6, p. 299, doi. 10.1515/teme-2015-0021
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- Article
Metrology-based quality and process control in automated stem cell production.
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- Technisches Messen, 2015, v. 82, n. 6, p. 309, doi. 10.1515/teme-2015-0036
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- Article
3D-Röntgentomographie-gestützte Verfolgung von Blasen in flüssigem Schaum Tracking of bubbles in liquid foam with 3D X-ray tomography.
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- Technisches Messen, 2015, v. 82, n. 6, p. 323, doi. 10.1515/teme-2015-0037
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- Article
Über die zeitlich aufgelöste Messung von Geschwindigkeiten mittels schneller Röntgentomographie On the temporally resolved measurement of velocities using fast X-ray tomography.
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- Technisches Messen, 2015, v. 82, n. 6, p. 317, doi. 10.1515/teme-2015-0038
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- Article
Frontmatter.
- Published in:
- Technisches Messen, 2015, v. 82, n. 6, p. i, doi. 10.1515/teme-2015-frontmatter6
- Publication type:
- Article