Found: 8
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Guiding Self-Assembly with the Tip of an Atomic Force Microscope.
- Published in:
- Scanning, 2002, v. 24, n. 3, p. 117, doi. 10.1002/sca.4950240302
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- Article
Tracers in vascular casting resins enhance backscattering brightness.
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- Scanning, 2002, v. 24, n. 3, p. 121, doi. 10.1002/sca.4950240303
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- Article
Error rates in dental microwear quantification using scanning electron microscopy.
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- Scanning, 2002, v. 24, n. 3, p. 144, doi. 10.1002/sca.4950240307
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- Article
Investigation of unusual inactivity of industrial platinum-rhodium catalyst gauze.
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- Scanning, 2002, v. 24, n. 3, p. 140, doi. 10.1002/sca.4950240306
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- Article
Application of the scatter diagram technique to the scanning electron microscope: Preliminary results from diamond.
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- Scanning, 2002, v. 24, n. 3, p. 109, doi. 10.1002/sca.4950240301
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- Article
Computer modeling of three-dimensional reconstruction algorithm of cathodoluminescence material properties, analysis of errors, and optimization of variable parameters.
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- Scanning, 2002, v. 24, n. 3, p. 127, doi. 10.1002/sca.4950240304
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- Article
Scanning tunneling microscope spectroscopy of polymers.
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- Scanning, 2002, v. 24, n. 3, p. 154, doi. 10.1002/sca.4950240308
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- Article
Direct assessment of recombination noise in semiconductors using electron beam-induced conductivity.
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- Scanning, 2002, v. 24, n. 3, p. 136, doi. 10.1002/sca.4950240305
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- Article