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Scanning electron microscopy in semiconductor research.
- Published in:
- Scanning, 1993, v. 15, n. 6, p. 315, doi. 10.1002/sca.4950150602
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- Article
Two classes of defect recombination behaviour in silicon as studied by SEM-EBIC.
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- Scanning, 1993, v. 15, n. 6, p. 316, doi. 10.1002/sca.4950150603
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- Publication type:
- Article
The influence of electrophysical parameters on spatial resolution of p-n junctions with EBIC measurements.
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- Scanning, 1993, v. 15, n. 6, p. 322, doi. 10.1002/sca.4950150604
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- Article
Cathodoluminescence from intermixed quantum-well structures: Evidence of remote luminescence.
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- Scanning, 1993, v. 15, n. 6, p. 325, doi. 10.1002/sca.4950150605
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- Article
Investigation of the formation of transition layers during LPE growth of GaAs.
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- Scanning, 1993, v. 15, n. 6, p. 333, doi. 10.1002/sca.4950150606
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- Article
Application of current-scanning deep level transient spectroscopy to deformed silicon crystals-first results.
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- Scanning, 1993, v. 15, n. 6, p. 338, doi. 10.1002/sca.4950150607
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- Publication type:
- Article
Determination of local deep-levels homogeneity using SEM.
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- Scanning, 1993, v. 15, n. 6, p. 345, doi. 10.1002/sca.4950150608
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- Publication type:
- Article
Panchromatic cathodoluminescence characterization of III-V lattice-mismatched heterostructures.
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- Scanning, 1993, v. 15, n. 6, p. 350, doi. 10.1002/sca.4950150609
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- Publication type:
- Article
Scanning-DLTS, EBIC, and CL Investigations of Diamond Indentations in GaAs p<sup>+</sup>n Junctions.
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- Scanning, 1993, v. 15, n. 6, p. 366, doi. 10.1002/sca.4950150610
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- Article
Masthead.
- Published in:
- Scanning, 1993, v. 15, n. 6, p. fmi, doi. 10.1002/sca.4950150601
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- Article