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Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1- applications to accurate dimension measurements.
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- Scanning, 2001, v. 23, n. 5, p. 298, doi. 10.1002/sca.4950230502
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- Article
Single-image signal-to-noise ratio estimation.
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- Scanning, 2001, v. 23, n. 5, p. 328, doi. 10.1002/sca.4950230506
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- Article
Microanalysis using secondary electrons in scanning electron microscopy.
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- Scanning, 2001, v. 23, n. 5, p. 295, doi. 10.1002/sca.4950230501
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- Article
Experimental data and model simulations of beam spread in the environmental scanning electron microscope.
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- Scanning, 2001, v. 23, n. 5, p. 320, doi. 10.1002/sca.4950230505
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- Article
Strategies for optimum use of superposition diffractogram in scanning electron microscopy.
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- Scanning, 2001, v. 23, n. 5, p. 351, doi. 10.1002/sca.4950230509
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- Article
Direct wet surface imaging of an anaerobic biofilm by environmental scanning electron microscopy: Application to landfill clay liner barriers.
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- Scanning, 2001, v. 23, n. 5, p. 346, doi. 10.1002/sca.4950230508
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- Article
Investigation of human hair fibers using lateral force microscopy.
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- Scanning, 2001, v. 23, n. 5, p. 337, doi. 10.1002/sca.4950230507
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- Article
Quality measures in applications of image restoration.
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- Scanning, 2001, v. 23, n. 5, p. 313, doi. 10.1002/sca.4950230504
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- Article
Light collection efficiency and light transport in backscattered electron scintillator detectors in scanning electron microscopy.
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- Scanning, 2001, v. 23, n. 5, p. 305, doi. 10.1002/sca.4950230503
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- Publication type:
- Article