Works matching IS 01422421 AND DT 2025 AND VI 57 AND IP 6

Results: 9

Cr(VI) Reduction on Fe(III) Solid Surfaces at Vacuum Pressures.

Published in:

Surface & Interface Analysis: SIA, 2025, v. 57, n. 6, p. 430, doi. 10.1002/sia.7400

By:

Jemison, Noah;
Benavidez, Angelica;
Gagnon, Kaelin;
Emeanuwa, Stephen;
Latta, Drew;
Garzon, Fernando H.;
Cabaniss, Stephen;
Lichtner, Peter C.;
Cerrato, José M.

Publication type:

Article

Deriving Stable Peak Models to Fit Complex XPS Data From Cu Contaminated Pt Electrocatalysts.

Published in:

Surface & Interface Analysis: SIA, 2025, v. 57, n. 6, p. 455, doi. 10.1002/sia.7401

By:

Saini, Sonakshi;
Bargiela, Pascal;
Fernandez, Vincent;
Fairley, Neal;
Parvin, Sahanaz;
Lee, Seunghoon;
Weber, Juliane;
McDowell, Matthew T.;
Baltrusaitis, Jonas

Publication type:

Article

Investigation of Electronic Energy Levels in a Weak Ferromagnetic Oxygen‐Deficient BiFeO2.85 Thick Film Using Absorption and X‐Ray Photoelectron Spectroscopic Studies.

Published in:

Surface & Interface Analysis: SIA, 2025, v. 57, n. 6, p. 419, doi. 10.1002/sia.7399

By:

Balakrishnan, Ramachandran;
Dixit, Ambesh;
Rao, Mamidanna Sri Ramachandra

Publication type:

Article

Surface Analysis Insight Note: Uncertainties in XPS Elemental Quantification.

Published in:

Surface & Interface Analysis: SIA, 2025, v. 57, n. 6, p. 389, doi. 10.1002/sia.7398

By:

Shard, Alexander G.;
Reed, Benjamen P.;
Cant, David J. H.

Publication type:

Article

Electron Spectroscopic Investigations of Alkaline‐Based Battery‐Relevant Reference Materials.

Published in:

Surface & Interface Analysis: SIA, 2025, v. 57, n. 6, p. 439, doi. 10.1002/sia.7397

By:

Oswald, Steffen;
Hantusch, Martin;
Gorbunov, Mikhail Vladimirovich;
Schmeida, Toni;
Thomas, Alexander;
Mikhailova, Daria

Publication type:

Article

Optical Constants and Electron Inelastic Mean‐Free Paths of SiO2, HfO2 and CaF2 Extracted From Reflection Electron Energy Loss Spectra.

Published in:

Surface & Interface Analysis: SIA, 2025, v. 57, n. 6, p. 445, doi. 10.1002/sia.7396

By:

Werner, Wolfgang S. M.;
Astašauskas, Vytautas;
Ridzel, Olga;
Bellissimo, Alessandra;
Stöger‐Pollach, Michael

Publication type:

Article

Modulating Properties of Cu2ZnSnS4 Thin Films With Broad Mg‐Doping Concentration by Sol–Gel Method.

Published in:

Surface & Interface Analysis: SIA, 2025, v. 57, n. 6, p. 407, doi. 10.1002/sia.7395

By:

Wang, Qingxu;
Liu, Xiaoyi;
He, Lei;
Tu, Yuchun;
Zhao, Jiaoling;
Chen, Jiayuan;
Duan, Yaping;
Lan, Rui;
Yuan, Yanyan

Publication type:

Article

Toward Integration of Dense, Contiguous, and Low‐Stress Capping Diamond on GaN/AlGaN Layer Using Two‐Step Growth Process.

Published in:

Surface & Interface Analysis: SIA, 2025, v. 57, n. 6, p. 396, doi. 10.1002/sia.7394

By:

Wang, Yingnan;
Ge, Lei;
Liu, Zonghao;
Hu, Xiufei;
Xu, Mingsheng;
Peng, Yan;
Wang, XiWei;
Han, Saibin;
Zhang, Xiaoyu;
Wang, Ziang;
Xu, Xiangang;
Hu, Xiaobo

Publication type:

Article

Issue Information.

Published in:: Surface & Interface Analysis: SIA, 2025, v. 57, n. 6, p. 387, doi. 10.1002/sia.7328
Publication type:: Article

Works matching IS 01422421 AND DT 2025 AND VI 57 AND IP 6

Cr(VI) Reduction on Fe(III) Solid Surfaces at Vacuum Pressures.

Deriving Stable Peak Models to Fit Complex XPS Data From Cu Contaminated Pt Electrocatalysts.

Investigation of Electronic Energy Levels in a Weak Ferromagnetic Oxygen‐Deficient BiFeO<sub>2.85</sub> Thick Film Using Absorption and X‐Ray Photoelectron Spectroscopic Studies.

Surface Analysis Insight Note: Uncertainties in XPS Elemental Quantification.

Electron Spectroscopic Investigations of Alkaline‐Based Battery‐Relevant Reference Materials.

Optical Constants and Electron Inelastic Mean‐Free Paths of SiO<sub>2</sub>, HfO<sub>2</sub> and CaF<sub>2</sub> Extracted From Reflection Electron Energy Loss Spectra.

Modulating Properties of Cu<sub>2</sub>ZnSnS<sub>4</sub> Thin Films With Broad Mg‐Doping Concentration by Sol–Gel Method.

Toward Integration of Dense, Contiguous, and Low‐Stress Capping Diamond on GaN/AlGaN Layer Using Two‐Step Growth Process.

Issue Information.