Found: 15
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Quantification from overlapping Auger peak-to-peak heights.
- Published in:
- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 856, doi. 10.1002/sia.1115
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- Article
Convenient calibration of FTIR peak 'size' for thin organic/polymer films.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 805, doi. 10.1002/sia.1119
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- Article
X-ray photoelectron spectroscopy study of carbon nitride coatings deposited by IR laser ablation in a remote nitrogen plasma atmosphere.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 815, doi. 10.1002/sia.1110
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- Article
Characterization of finishing on polyamide fibres.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 847, doi. 10.1002/sia.1114
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- Article
Evaluation of amine- and amide-terminated self-assembled monolayers as 'Molecular glues' for Au and SiO<sub>2</sub> substrates.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 809, doi. 10.1002/sia.1125
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- Article
Two-band photoluminescence spectra from nanometre Si particle-embedded Si oxide films.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 890, doi. 10.1002/sia.1112
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- Article
Influence of interfacial depth on depth resolution during GDOES depth profiling analysis of thin alumina films.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 869, doi. 10.1002/sia.1120
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- Article
Simplified equations for correction parameters for elastic scattering effects in AES and XPS for Q, β and attenuation lengths.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 835, doi. 10.1002/sia.1113
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- Article
Analysis of the x-ray photoelectron energy-loss background in silicides.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 881, doi. 10.1002/sia.1124
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- Article
Peak or centroid - which parameter is better suited for quantifying apparent marker locations in low-energy sputter depth profiling with reactive primary ion beams?
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 893, doi. 10.1002/sia.1117
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- Article
SAXS analysis of interface in organo-modified mesoporous silica.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 897, doi. 10.1002/sia.1118
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- Article
Oxidation studies of Au-Al alloys using x-ray photoelectron spectroscopy (XPS) and x-ray absorption near-edge structure (XANES).
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 874, doi. 10.1002/sia.1123
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- Article
Elastic electron backscattering from overlayer/substrate systems.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 825, doi. 10.1002/sia.1111
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- Article
Level of consistency in quantification and IMFP determination by the Tougaard method applied to XPS of a Langmuir-Blodgett film taken at widely different emission angles.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 862, doi. 10.1002/sia.1116
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- Article
Yield enhancement effect of low-energy O<sub>2</sub><sup>+</sup> ion bombardment in Ga focused ion beam SIMS.
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- Surface & Interface Analysis: SIA, 2001, v. 31, n. 9, p. 901, doi. 10.1002/sia.1122
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- Article