Found: 12
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Monte Carlo simulation on the electron beam incident angle with spherical particles applied to the energy loss in ZnS phosphor powders.
- Published in:
- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 807, doi. 10.1002/1096-9918(200012)29:12<807::AID-SIA930>3.0.CO;2-B
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Surface study of perfluoropolyether-urethane cross-linked polymers.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 873, doi. 10.1002/1096-9918(200012)29:12<873::AID-SIA941>3.0.CO;2-C
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Optimizing the ellipsometric analysis of a transparent layer on glass.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 845, doi. 10.1002/1096-9918(200012)29:12<845::AID-SIA938>3.0.CO;2-Q
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Standard test data for estimating peak parameter errors in x-ray photoelectron spectroscopy III. Errors with different curve-fitting approaches.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 856, doi. 10.1002/1096-9918(200012)29:12<856::AID-SIA940>3.0.CO;2-8
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- Article
Behaviour of copper and generation of oxygen during anodizing of Nb-Cu alloys.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 895, doi. 10.1002/1096-9918(200012)29:12<895::AID-SIA944>3.0.CO;2-W
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- Article
ToF-SIMS quantification of albumin adsorbed on plasma-deposited fluoropolymers by partial least-squares regression.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 837, doi. 10.1002/1096-9918(200012)29:12<837::AID-SIA937>3.0.CO;2-O
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- Article
Uncertainty in measurement of overlayer thickness of thermally oxidized silicon using x-ray photoelectron spectroscopy.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 891, doi. 10.1002/1096-9918(200012)29:12<891::AID-SIA943>3.0.CO;2-A
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Chemistry of surface modification with UV/ozone for improved intercoat adhesion in multilayered coating systems.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 829, doi. 10.1002/1096-9918(200012)29:12<829::AID-SIA936>3.0.CO;2-M
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- Article
XPS study of reactively sputtered Ti-B-N hard coatings.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 823, doi. 10.1002/1096-9918(200012)29:12<823::AID-SIA933>3.0.CO;2-C
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- Article
Characterization of supported Nb catalysts by ToF-SIMS.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 818, doi. 10.1002/1096-9918(200012)29:12<818::AID-SIA931>3.0.CO;2-4
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- Article
Experimental valuation of net atomic charge via XPS†.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 851, doi. 10.1002/1096-9918(200012)29:12<851::AID-SIA939>3.0.CO;2-Y
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GDOES depth profiling analysis and cross-sectional transmission electron microscopy of a hard disk.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 12, p. 887, doi. 10.1002/1096-9918(200012)29:12<887::AID-SIA942>3.0.CO;2-X
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- Article