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Mechanism of Facet Formation on Ni Surfaces by Sputtering with Oxygen Ion Beams
- Published in:
- Surface & Interface Analysis: SIA, 1998, v. 26, n. 3, p. 224
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- Publication type:
- Article
Depth Profiling of an Ino.53Ga0.47As/InP Multilayer Sample Using Grazing-incidence Sputtered Neutral Mass Spectrometry with Laser Post-ionization
- Published in:
- Surface & Interface Analysis: SIA, 1998, v. 26, n. 3, p. 220
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- Publication type:
- Article
Characterization of Titanium Hydride Film After Long-term Air Interaction: SEM, ARXPS and AES Depth Profile Studies
- Published in:
- Surface & Interface Analysis: SIA, 1998, v. 26, n. 3, p. 213
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- Publication type:
- Article
Some Aspects to the Fitting of XPS Core Spectra of Polymers
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- Surface & Interface Analysis: SIA, 1998, v. 26, n. 3, p. 204
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- Publication type:
- Article
Resolution Enhancement of X-ray Photoelectron Spectra by Maximum Entropy Deconvolution
- Published in:
- Surface & Interface Analysis: SIA, 1998, v. 26, n. 3, p. 195
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- Article
Analysis of Three-dimensional SIMS Images using Image Cross-correlation Spectroscopy
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- Surface & Interface Analysis: SIA, 1998, v. 26, n. 3, p. 188
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- Publication type:
- Article
Passivation of III-v Compounds Used for Metal-Insulator-InP(100) Structures
- Published in:
- Surface & Interface Analysis: SIA, 1998, v. 26, n. 3, p. 177
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- Publication type:
- Article
Escape Probability of s-Photoelectrons Leaving Aluminium and Copper Oxides
- Published in:
- Surface & Interface Analysis: SIA, 1998, v. 26, n. 3, p. 182
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- Publication type:
- Article