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SINGLE EVENT EFFECTS IN AVIONICS AND ON THE GROUND.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 285, doi. 10.1142/S0129156404002351
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- Article
SOFT ERRORS IN COMMERCIAL INTEGRATED CIRCUITS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 299, doi. 10.1142/S0129156404002363
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- Article
SINGLE-EVENT EFFECTS IN III-V SEMICONDUCTOR ELECTRONICS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 311, doi. 10.1142/S0129156404002375
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- Article
INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 327, doi. 10.1142/S0129156404002387
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- Article
SYSTEM LEVEL SINGLE EVENT UPSET MITIGATION STRATEGIES.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 341, doi. 10.1142/S0129156404002399
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- Article
RADIATION-TOLERANT DESIGN FOR HIGH PERFORMANCE MIXED-SIGNAL CIRCUITS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 353, doi. 10.1142/S0129156404002405
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- Article
A TOTAL-DOSE HARDENING-BY-DESIGN APPROACH FOR HIGH-SPEED MIXED-SIGNAL CMOS INTEGRATED CIRCUITS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 367, doi. 10.1142/S0129156404002417
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- Article
RADIATION ISSUES IN THE NEW GENERATION OF HIGH ENERGY PHYSICS EXPERIMENTS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 379, doi. 10.1142/S0129156404002429
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- Article
SPACE RADIATION EFFECTS IN OPTOCOUPLERS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 401, doi. 10.1142/S0129156404002430
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- Article
RADIATION EFFECTS IN CHARGE-COUPLED DEVICE (CCD) IMAGERS AND CMOS ACTIVE PIXEL SENSORS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 419, doi. 10.1142/S0129156404002442
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- Article
THE EFFECTS OF SPACE RADIATION EXPOSURE ON POWER MOSFETS:: A REVIEW.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 445, doi. 10.1142/S0129156404002454
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- Article
INTRODUCTION TO SOI MOSFETs:: CONTEXT, RADIATION EFFECTS, AND FUTURE TRENDS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 465, doi. 10.1142/S0129156404002466
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- Article
TOTAL-DOSE AND SINGLE-EVENT EFFECTS IN SILICON-GERMANIUM HETEROJUNCTION BIPOLAR TRANSISTORS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 489, doi. 10.1142/S0129156404002478
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- Article
GAIN DEGRADATION AND ENHANCED LOW-DOSE-RATE SENSITIVITY IN BIPOLAR JUNCTION TRANSISTORS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 503, doi. 10.1142/S012915640400248X
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- Article
TOTAL DOSE EFFECTS IN LINEAR BIPOLAR INTEGRATED CIRCUITS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 519, doi. 10.1142/S0129156404002491
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- Article
HARDNESS ASSURANCE FOR COMMERCIAL MICROELECTRONICS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 543, doi. 10.1142/S0129156404002508
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- Article
IONIZING RADIATION EFFECTS ON ULTRA-THIN OXIDE MOS STRUCTURES.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 563, doi. 10.1142/S012915640400251X
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- Article
HYDROGEN AT THE Si/SiO<sub>2</sub> INTERFACE:: FROM ATOMIC-SCALE CALCULATIONS TO ENGINEERING MODELS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 575, doi. 10.1142/S0129156404002521
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- Article
SWITCHING OXIDE TRAPS.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 581, doi. 10.1142/S0129156404002533
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- Article
ONLINE AND REALTIME DOSIMETRY USING OPTICALLY STIMULATED LUMINESCENCE.
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- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 605, doi. 10.1142/S0129156404002545
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- Article