Found: 6

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  • RF Mos Measurements.

    Published in:
    International Journal of High Speed Electronics & Systems, 2001, v. 11, n. 4, p. 887, doi. 10.1142/S0129156401001039
    By:
    • Sischka, Franz;
    • Gneiting, Thomas
    Publication type:
    Article

  • Mosfet Modeling and Parameter Extraction for RF IC's.

    Published in:
    International Journal of High Speed Electronics & Systems, 2001, v. 11, n. 4, p. 953, doi. 10.1142/S0129156401001040
    By:
    • Je, Minkyu;
    • Kwon, Ickjin;
    • Shin, Hyungcheol;
    • Lee, Kwyro
    Publication type:
    Article

  • Mosfet Modeling for RF IC Design.

    Published in:
    International Journal of High Speed Electronics & Systems, 2001, v. 11, n. 4, p. 1007, doi. 10.1142/S0129156401001052
    By:
    • Cheng, Yuhua
    Publication type:
    Article

  • RF CMOS Noise Characterization and Modeling.

    Published in:
    International Journal of High Speed Electronics & Systems, 2001, v. 11, n. 4, p. 1085, doi. 10.1142/S0129156401001064
    By:
    • Chen, Chih-Hung;
    • Deen, M. Jamal
    Publication type:
    Article

  • SOI CMOS Transistors for RF and Microwave Applications.

    Published in:
    International Journal of High Speed Electronics & Systems, 2001, v. 11, n. 4, p. 1159, doi. 10.1016/S0129-1564(01)00107-6
    By:
    • Flandre, D.;
    • Raskin, J.-P.;
    • Vanhoenacker-Janvier, D.
    Publication type:
    Article

  • RF CMOS Reliability.

    Published in:
    International Journal of High Speed Electronics & Systems, 2001, v. 11, n. 4, p. 1249, doi. 10.1142/S0129156401001088
    By:
    • Naseh, Sasan;
    • Deen, M. Jamal
    Publication type:
    Article